Influence of oxygen concentration on the two-magnon light scattering spectra in YBa2Cu3O6+x single crystals

1990 ◽  
Vol 169 (5-6) ◽  
pp. 381-385 ◽  
Author(s):  
A.V. Bazhenov ◽  
A.A. Maksimov ◽  
D.A. Pronin ◽  
I.I. Tartakovskii ◽  
V.B. Timofeev
1991 ◽  
Vol 185-189 ◽  
pp. 1023-1024
Author(s):  
A.V. Bazhenov ◽  
A.A. Maksimov ◽  
D.A. Pronin ◽  
I.I. Tartakovskii ◽  
V.B. Timofeev

1990 ◽  
Vol 41 (3) ◽  
pp. 365-367 ◽  
Author(s):  
L Forro ◽  
C Ayache ◽  
J Y Henry ◽  
J Rossat-Mignod

1996 ◽  
Vol 442 ◽  
Author(s):  
O.V. Astafiev ◽  
V.P. Kalinushkin ◽  
N.V. Abrosimov

AbstractMapping Low Angle Light Scattering method (MLALS) is proposed to study defect structure in materials used for solar cell production. Several types of defects are observed in Czochralski Si1−xGex (0.022<x<0.047) single crystals. Recombination activity of these defects is investigated. The possibility of contactless visualisation of grain boundary recombination in polysilicon is also demonstrated.


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