Inspection Of Recombination Active Defects For Sige And Solar Cells
Keyword(s):
AbstractMapping Low Angle Light Scattering method (MLALS) is proposed to study defect structure in materials used for solar cell production. Several types of defects are observed in Czochralski Si1−xGex (0.022<x<0.047) single crystals. Recombination activity of these defects is investigated. The possibility of contactless visualisation of grain boundary recombination in polysilicon is also demonstrated.
2019 ◽
Vol 7
(41)
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pp. 23739-23746
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Keyword(s):
Keyword(s):
2017 ◽
Vol 5
(14)
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pp. 6515-6521
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2019 ◽
Vol 74
(8)
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pp. 683-688
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Keyword(s):
2021 ◽
pp. 148-175