In Situ Real-Time Low-Energy Electron Microscopy

2018 ◽  
pp. 287-294
Author(s):  
M.B. Casu
Keyword(s):  
Electron Microscopy ◽  
Real Time ◽  
Low Energy ◽  
Energy Electron ◽  
Low Energy Electron

In situ real-time studies of GaN growth on 6H–SiC(0001) by low-energy electron microscopy (LEEM)

1998 ◽  
Vol 189-190 ◽  
pp. 310-316 ◽  
Author(s):  
A Pavlovska ◽  
E Bauer ◽  
V.M Torres ◽  
J.L Edwards ◽  
R.B Doak ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Real Time ◽  
Low Energy ◽  
Energy Electron ◽  
Low Energy Electron

Real-time observation of graphene oxidation on Pt(111) by low-energy electron microscopy

2016 ◽  
Vol 644 ◽  
pp. 165-169 ◽  
Author(s):  
Viktor Johánek ◽  
Gregory W. Cushing ◽  
Jason K. Navin ◽  
Ian Harrison
Keyword(s):  
Electron Microscopy ◽  
Real Time ◽  
Low Energy ◽  
Energy Electron ◽  
Low Energy Electron ◽  
Time Observation ◽  
Graphene Oxidation ◽  
Real Time Observation

Real Time Magnetic Imaging by Spin-Polarized Low Energy Electron Microscopy with Highly Spin-Polarized and High Brightness Electron Gun

2010 ◽  
Vol 3 (2) ◽  
pp. 026601 ◽  
Author(s):  
Masahiko Suzuki ◽  
Michihiro Hashimoto ◽  
Tsuneo Yasue ◽  
Takanori Koshikawa ◽  
Yasuhide Nakagawa ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Real Time ◽  
Low Energy ◽  
Energy Electron ◽  
Electron Gun ◽  
High Brightness ◽  
Magnetic Imaging ◽  
Spin Polarized ◽  
Low Energy Electron

IN SITU STUDIES WITH LOW-ENERGY ELECTRON MICROSCOPY

1995 ◽  
Vol 02 (01) ◽  
pp. 103-107
Author(s):  
RUUD M. TROMP
Keyword(s):  
Electron Microscopy ◽  
Low Energy ◽  
Energy Electron ◽  
Misfit Dislocations ◽  
Dynamical Processes ◽  
In Situ Studies ◽  
Kinetic Instability ◽  
In Situ Observations ◽  
Low Energy Electron

This paper gives a brief review of low-energy electron microscopy (LEEM) as used for in situ studies of surface dynamical processes. The capabilities of LEEM are illustrated with two examples. One is a kinetic instability observed during growth of the first layer of CaF 2 on Si (111). The second concerns the nucleation of misfit dislocations during the growth of thicker, epitaxial CaF 2 films on Si (111), as the critical thickness is exceeded. Both examples highlight the importance of real time, in situ observations of surface dynamical processes.

In situ imaging of structural changes in a chemical wave with low-energy electron microscopy: the system Rh(110)/NO+H2

2000 ◽  
Vol 318 (6) ◽  
pp. 549-554 ◽  
Author(s):  
Th. Schmidt ◽  
A. Schaak ◽  
S. Günther ◽  
B. Ressel ◽  
E. Bauer ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Structural Changes ◽  
Low Energy ◽  
Energy Electron ◽  
Low Energy Electron ◽  
In Situ Imaging
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