Surface phase transformations in the Ni/Si(111) system observed in real time using low‐energy electron microscopy

1995 ◽  
Vol 13 (3) ◽  
pp. 1728-1732 ◽  
Author(s):  
P. A. Bennett ◽  
M. Y. Lee ◽  
S. A. Parikh ◽  
K. Wurm ◽  
R. J. Phaneuf
1989 ◽  
Vol 159 ◽  
Author(s):  
E. Bauer ◽  
M. Mundschau ◽  
W. Swiech ◽  
W. Telieps

ABSTRACTLow energy electron microscopy (LEEM) is briefly introduced and its application to the study of surface defects, surface phase transitions on Si(111), crystal growth and sublimation on Si(100) is illustrated.


2016 ◽  
Vol 644 ◽  
pp. 165-169 ◽  
Author(s):  
Viktor Johánek ◽  
Gregory W. Cushing ◽  
Jason K. Navin ◽  
Ian Harrison

2010 ◽  
Vol 3 (2) ◽  
pp. 026601 ◽  
Author(s):  
Masahiko Suzuki ◽  
Michihiro Hashimoto ◽  
Tsuneo Yasue ◽  
Takanori Koshikawa ◽  
Yasuhide Nakagawa ◽  
...  

1998 ◽  
Vol 189-190 ◽  
pp. 310-316 ◽  
Author(s):  
A Pavlovska ◽  
E Bauer ◽  
V.M Torres ◽  
J.L Edwards ◽  
R.B Doak ◽  
...  

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