As the service life of the assembly equipment are short, the tightening data it produces are very limited. Therefore, data-driven assembly quality diagnosis is still a challenge task in industries. Transfer learning can be used to address small data problems. However, transfer learning has strict requirements on the training dataset, which is hard to satisfy. To solve the above problem, an Improved Deep Convolution Generative Adversarial Transfer Learning Model (IDCGAN-TM) is proposed, which integrates three modules: The generative learning module automatically produces source datasets based on small target datasets by using the improved generative-adversarial theory. The feature learning module improves the feature extraction ability by building a lightweight deep learning model (DL). The transfer learning module consists of a pre-trained DL and a one fully connected layer to better perform the intelligent quality diagnosis on the training small sample data. A parallel computing method is adopted to obtain produced source data efficiently. Real assembly quality diagnosis cases are designed and discussed to validate the advance of the proposed model. In addition, the comparison experiments are designed to show that the proposed approach holds the better transfer diagnosis performance compared with the existing three state-of-art approaches.
Rapid 3D phenotypic analysis of neurons and organoids using data-driven cell segmentation-free machine learning
