Retinal damage related to high-intensity light-emitting diode exposure: An in vivo study

2021 ◽  
Author(s):  
Marcela Emílio de Araújo ◽  
Marina Bozzini Paies ◽  
Ana Beatriz Arrais ◽  
Fernando Ladd Lobo ◽  
Ruthnaldo Rodrigues Melo de Lima ◽  
...  
Keyword(s):  
High Intensity ◽  
Light Emitting Diode ◽  
In Vivo Study ◽  
Retinal Damage ◽  
Light Emitting ◽  
High Intensity Light

scholarly journals Microleakage under Orthodontic Brackets Using High-Intensity Curing Lights

2009 ◽  
Vol 79 (1) ◽  
pp. 144-149 ◽  
Author(s):  
Mustafa Ulker ◽  
Tancan Uysal ◽  
Sabri Ilhan Ramoglu ◽  
Huseyin Ertas
Keyword(s):  
High Intensity ◽  
Light Emitting Diode ◽  
Bonferroni Correction ◽  
Light Emitting ◽  
Halogen Light ◽  
Halogen Light Source ◽  
Light Curing ◽  
Curing Light ◽  
High Intensity Light ◽  
Nail Varnish

Abstract Objective: To compare the microleakage of the enamel-adhesive-bracket complex at the occlusal and gingival margins of brackets bonded with high-intensity light curing lights and conventional halogen lights. Materials and Methods: Forty-five freshly extracted human maxillary premolar teeth were randomly separated into three groups of 15 teeth each. Stainless steel brackets were bonded in all groups according to the manufacturer's recommendations. Specimens (15 per group) were cured for 40 seconds with a conventional halogen light, 20 seconds with light-emitting diode (LED), and 6 seconds with plasma arc curing light (PAC). After curing, the specimens were further sealed with nail varnish, stained with 0.5% basic-fuchsine for 24 hours, sectioned and examined under a stereomicroscope, and scored for microleakage for the enamel-adhesive and bracket-adhesive interfaces from both the occlusal and gingival margins. Statistical analyses were performed using Kruskal-Wallis and Mann-Whitney U-tests with a Bonferroni correction. Results: The type of light curing unit did not significantly affect the amount of microleakage at the gingival or occlusal margins of investigated interfaces (P >.05). The gingival sides in the LED and PAC groups exhibited higher microleakage scores compared with those observed on occlusal sides for the enamel-adhesive and adhesive-bracket interfaces. The halogen light source showed similar microleakage at the gingival and occlusal sides between both adhesive interfaces. Conclusions: High-intensity curing units did not cause more microleakage than conventional halogen lights. This supports the use of all these curing units in routine orthodontic practice.

Curing efficiency of high-intensity light-emitting diode (LED) devices

2010 ◽  
Vol 52 (2) ◽  
pp. 187-195 ◽  
Author(s):  
Christos Rahiotis ◽  
Katerina Patsouri ◽  
Nick Silikas ◽  
Afrodite Kakaboura
Keyword(s):  
High Intensity ◽  
Light Emitting Diode ◽  
Light Emitting ◽  
High Intensity Light

Curing Efficiency of Three Different Curing Modes at Different Distances for Four Composites

2011 ◽  
Vol 36 (4) ◽  
pp. 362-371 ◽  
Author(s):  
S Zhu ◽  
J Platt
Keyword(s):  
Exposure Time ◽  
High Intensity ◽  
Clinical Relevance ◽  
Light Emitting Diode ◽  
Light Emitting ◽  
Curing Light ◽  
Deep Cavities ◽  
High Intensity Light

Clinical Relevance Doubling the exposure time of a high-intensity light-emitting diode curing light with a turbo tip and autofocus capability does not predictably compensate for distance in deep cavities.

High-intensity light-emitting diode vs fluorescent tubes for intensive phototherapy in neonates

2016 ◽  
Vol 36 (2) ◽  
pp. 127-133 ◽  
Author(s):  
Hanan S. Sherbiny ◽  
Doaa M. Youssef ◽  
Ahmad S. Sherbini ◽  
Rabab El-Behedy ◽  
Laila M. Sherief
Keyword(s):  
High Intensity ◽  
Light Emitting Diode ◽  
Light Emitting ◽  
High Intensity Light

scholarly journals Long-term Failure Rate of Brackets Bonded with Plasma and High-intensity Light-emitting Diode Curing Lights

2007 ◽  
Vol 77 (4) ◽  
pp. 707-710 ◽  
Author(s):  
Nikolaos Pandis ◽  
Sophia Strigou ◽  
Theodore Eliades
Keyword(s):  
Failure Rate ◽  
High Intensity ◽  
Irradiation Time ◽  
Light Emitting Diode ◽  
Posterior Teeth ◽  
Similar Treatment ◽  
Light Emitting ◽  
Curing Light ◽  
High Intensity Light

Abstract Objective: To comparatively assess the long-term failure rate of brackets bonded with a plasma or a high-intensity light-emitting diode (LED) curing light. Materials and Methods: Twenty-five patients with complete permanent dentitions with similar treatment planning and mechanotherapy were selected for the study. Brackets were bonded according to a split-mouth design with the 3M Ortholite Plasma or the high-power Satelec mini LED Ortho curing light. Irradiation with the two curing lights was performed for 9 seconds at an alternate quadrant sequence so that the bonded brackets cured with either light were equally distributed on the maxillary and mandibular right and left quadrants. First-time bracket failures were recorded for a mean period of 15 months (range 13–18 months) and the results were analyzed with the chi-square test and binary logistic regression. Results: The failure rate for brackets was 2.8% for the plasma light and 6.7% for the LED light source. Although significantly more failures were found for the mandibular arch, no difference was identified in failure rate between anterior and posterior teeth. Conclusions: High-intensity LED curing lights present a 2.5 times higher failure rate relative to plasma lamps for nominally identical irradiation time. Mandibular teeth show almost 150% higher failure incidence compared with maxillary teeth. No effect from the arch side (right vs left) and location (anterior vs posterior) was identified in this study.

scholarly journals Effects of High-Intensity Curing Lights on Microleakage under Bonded Lingual Retainers

2008 ◽  
Vol 78 (6) ◽  
pp. 1084-1088 ◽  
Author(s):  
Asli Baysal ◽  
Tancan Uysal ◽  
Mustafa Ulker ◽  
Serdar Usumez
Keyword(s):  
High Intensity ◽  
Light Emitting Diode ◽  
Light Sources ◽  
Composite Wire ◽  
Mandibular Incisor ◽  
Light Emitting ◽  
Halogen Light ◽  
Significant Difference ◽  
Light Curing ◽  
High Intensity Light

Abstract Objective: To evaluate the effects of high-intensity light curing units (light-emitting diode [LED] and plasma arc curing [PAC]) on the microleakage of flexible spiral wire retainers (FSWRs) at the composite/enamel and composite/wire interfaces. Materials and Methods: Forty-five human mandibular incisor teeth were separated into three groups of 15 teeth. Multistranded PentaOne wire of .0215 inch diameter was bonded to enamel and was cured with three different light curing units: a quartz-tungsten-halogen (QTH) unit and two high-intensity units (ie, LED and PAC). A conventional halogen light served as the control. Samples were sealed with nail varnish, stained with 0.5% basic fuchsine, and sectioned. Transverse sections were evaluated under a stereomicroscope and were scored for microleakage for the composite/enamel and composite/wire interfaces. Statistical analysis was performed by Kruskal-Wallis and Mann-Whitney U-tests with Bonferroni correction. Results: Little or no microleakage was detected at the composite/enamel interface of the FSWR cured with three different light sources. However, at the composite/wire interface, statistically significant differences were found between the QTH (mean, 1.10 ± 1.05 mm) and high-intensity curing units. The PAC resulted in the greatest amount of microleakage (mean, 2.63 ± 1.49 mm), whereas no statistically significant difference was noted between the PAC and the LED (mean, 2.35 ± 1.28 mm). Conclusion: High-intensity light curing units show statistically significant microleakage at the composite/wire interface and therefore may not be safe for use in bonding FSWRs.

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