scholarly journals Generalized double-integral Ostrowski type inequalities on time scales

2011 ◽  
Vol 24 (8) ◽  
pp. 1461-1467 ◽  
Author(s):  
Sabir Hussain ◽  
Muhammad Amer Latif ◽  
Mohammad Alomari
Keyword(s):  
2021 ◽  
Vol 2 (2) ◽  
pp. 38-49
Author(s):  
David AFARIOGUN ◽  
Adesanmi MOGBADEMU ◽  
Hallowed OLAOLUWA

We introduce and study some properties of fuzzy Henstock-Kurzweil-Stietljes-$ \Diamond $-double integral on time scales. Also, we state and prove the uniform convergence theorem, monotone convergence theorem and dominated convergence theorem for the fuzzy Henstock-Kurzweil Stieltjes-$\Diamond$-double integrable functions on time scales.


2011 ◽  
Vol 2011 ◽  
pp. 1-21 ◽  
Author(s):  
S. H. Saker

Our aim in this paper is to establish some explicit bounds of the unknown function in a certain class of nonlinear dynamic inequalities in two independent variables on time scales which are unbounded above. These on the one hand generalize and on the other hand furnish a handy tool for the study of qualitative as well as quantitative properties of solutions of partial dynamic equations on time scales. Some examples are considered to demonstrate the applications of the results.


2007 ◽  
Vol 54 (1) ◽  
pp. 45-57 ◽  
Author(s):  
Martin Bohner ◽  
Gusein Sh. Guseinov

2021 ◽  
Vol 4 (2) ◽  
pp. 1-7
Author(s):  
David Adebisi Afariogun ◽  
Adesanmi Alao Mogbademu

We employ the concept of interval-valued functions to state and prove an existence result for the Henstock-Kurzweil-Stieltjes-⋄-double integral on time scales.


2020 ◽  
Vol 2020 (1) ◽  
Author(s):  
Sobia Rafeeq ◽  
Humaira Kalsoom ◽  
Sabir Hussain ◽  
Saima Rashid ◽  
Yu-Ming Chu

Author(s):  
James B. Pawley

Past: In 1960 Thornley published the first description of SEM studies carried out at low beam voltage (LVSEM, 1-5 kV). The aim was to reduce charging on insulators but increased contrast and difficulties with low beam current and frozen biological specimens were also noted. These disadvantages prevented widespread use of LVSEM except by a few enthusiasts such as Boyde. An exception was its use in connection with studies in which biological specimens were dissected in the SEM as this process destroyed the conducting films and produced charging unless LVSEM was used.In the 1980’s field emission (FE) SEM’s came into more common use. The high brightness and smaller energy spread characteristic of the FE-SEM’s greatly reduced the practical resolution penalty associated with LVSEM and the number of investigators taking advantage of the technique rapidly expanded; led by those studying semiconductors. In semiconductor research, the SEM is used to measure the line-width of the deposited metal conductors and of the features of the photo-resist used to form them. In addition, the SEM is used to measure the surface potentials of operating circuits with sub-micrometer resolution and on pico-second time scales. Because high beam voltages destroy semiconductors by injecting fixed charges into silicon oxide insulators, these studies must be performed using LVSEM where the beam does not penetrate so far.


1985 ◽  
Vol 46 (C7) ◽  
pp. C7-357-C7-361 ◽  
Author(s):  
J. Friedrich ◽  
D. Haarer

2013 ◽  
Vol 40 (3) ◽  
pp. 185-203
Author(s):  
Dhahri Maher ◽  
Bellakhel Ghazi ◽  
Chahed Jamel

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