Determination of the thickness and density of the ion bombardment induced altered layer in SiC by means of reflection electron energy loss study

2005 ◽  
Vol 252 (5) ◽  
pp. 1785-1792 ◽  
Author(s):  
L. Kotis ◽  
A. Sulyok ◽  
M. Menyhard ◽  
J.B. Malherbe ◽  
R.Q. Odendaal
ACS Nano ◽  
2016 ◽  
Vol 10 (7) ◽  
pp. 6680-6684 ◽  
Author(s):  
Mitsutaka Haruta ◽  
Yoshiteru Hosaka ◽  
Noriya Ichikawa ◽  
Takashi Saito ◽  
Yuichi Shimakawa ◽  
...  

2000 ◽  
Vol 266-269 ◽  
pp. 765-768 ◽  
Author(s):  
A.C Ferrari ◽  
B Kleinsorge ◽  
G Adamopoulos ◽  
J Robertson ◽  
W.I Milne ◽  
...  

Sign in / Sign up

Export Citation Format

Share Document