Comparison of intrinsic zero-energy loss and Shirley-type background corrected profiles of XPS spectra for quantitative surface analysis: Study of Cr, Mn and Fe oxides
2008 ◽
Vol 254
(16)
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pp. 5141-5148
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Keyword(s):
2014 ◽
Vol 28
(14)
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pp. 1639-1639
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The angular dependence on photoemission and its significance to quantitative surface analysis by XPS
1981 ◽
Vol 3
(2)
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pp. 67-71
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1979 ◽
Vol 12
(2)
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pp. 89-90
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1981 ◽
Vol 7
(4)
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pp. 419-424
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