AbstractEpileptic seizure (ES) is a neurological brain dysfunction. ES can be detected using the electroencephalogram (EEG) signal. However, visual inspection of ES using long-time EEG recordings is a difficult, time-consuming and a costly procedure. Thus, automatic epilepsy recognition is of primary importance. In this paper, a new method is proposed for automatic ES recognition using short-time EEG recordings. The method is based on first decomposing the EEG signals on sub-signals using discrete wavelet transform. Then, from the obtained sub-signals, different non-linear parameters such as approximate entropy (ApEn), largest Lyapunov exponents (LLE) and statistical parameters are determined. These parameters along with phase entropies, calculated through higher order spectrum analysis, are used as an input vector of a multi-class support vector machine (MSVM) for ES recognition. The proposed method is evaluated using the standard EEG database developed by the Department of Epileptology, University of Bonn, Germany. The evaluation is carried out through a large number of classification experiments. Different statistical metrics namely Sensitivity (Se), Specificity (Sp) and classification accuracy (Ac) are calculated and compared to those obtained in the scientific research literature. The obtained results show that the proposed method achieves high accuracies, which are as good as the best existing state-of-the-art methods studied using the same EEG database.
Non-linear Analysis of Intracranial Electroencephalogram Recordings with Approximate Entropy and Lempel-Ziv Complexity for Epileptic Seizure Detection
