Covariance intersection-based sensor fusion for sounding rocket tracking and impact area prediction

For mass application positioning demands, the current single positioning sensor cannot provide reliable and accurate positioning. Herein, we present batch inverse covariance intersection (BICI) and BICI with interacting multiple model (BICI-IMM) multi-sensor fusion positioning methods, which are based on the batch form of the sequential inverse covariance intersection (SICI) fusion method. Meanwhile, it is proved that the BICI is robust. Compared with SICI, BICI-IMM reduces estimation error variance of the motion model and has less conservativeness. The BICI-IMM algorithm improves the accuracy of local filtering by interacting with multiple models and realizes global fusion estimation based on BICI. The validity of the BICI and BICI-IMM algorithm are demonstrated by two simulations and experiments in the open and semi-open scenes, and its positioning accuracy relations are shown. In addition, it is demonstrated that the BICI-IMM algorithm can improve the positioning accuracy in the actual scenes.

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Design of Multi-sensor Fusion Architectures Based on the Covariance Intersection Algorithm—Estimating Calculation Burdens

Journal of Intelligent & Robotic Systems ◽

10.1007/s10846-021-01347-9 ◽

2021 ◽

Vol 101 (4) ◽

Author(s):

Bilal Daass ◽

Denis Pomorski ◽

Kamel Haddadi

Keyword(s):

Sensor Fusion ◽

Covariance Intersection ◽

Intersection Algorithm

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Observed and Theoretical Spectra in the 10–100Å Interval

International Astronomical Union Colloquium ◽

10.1017/s0252921100107869 ◽

1988 ◽

Vol 102 ◽

pp. 259-261

Author(s):

W.A. Brown ◽

M.E. Bruner ◽

L.W. Acton

Keyword(s):

Sounding Rocket ◽

Full Spectrum ◽

X Ray

AbstractThe soft x-ray spectra recorded in two sounding rocket flights in 1982 and 1985 are compared with with predicted spectra. The poster presents the processed densitometer trace of the full spectrum together with the new spectrum from the 1985 experiment. This note compares the intensities of the lines with predictions.

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High-resolution topographic SEM and radiation damage: The rationale for using low beam voltage

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100131024 ◽

1992 ◽

Vol 50 (2) ◽

pp. 1278-1279

Author(s):

James Pawley ◽

David Joy

Keyword(s):

High Resolution ◽

Imaging Techniques ◽

Morphological Structure ◽

Radiation Sensitivity ◽

Beam Specimen ◽

Measured Signal ◽

Practical Consideration ◽

Interaction Volume ◽

Impact Area ◽

Signal Contrast

The scanning electron microscope (SEM) builds up an image by sampling contiguous sub-volumes near the surface of the specimen. A fine electron beam selectively excites each sub-volume and then the intensity of some resulting signal is measured and then plotted as a corresponding intensity in an image. The spatial resolution of such an image is limited by at least three factors. Two of these determine the size of the interaction volume: the size of the electron probe and the extent to which detectable signal is excited from locations remote from the beam impact area. A third limitation emerges from the fact that the probing beam is composed of a number of discrete particles and therefore that the accuracy with which any detectable signal can be measured is limited by Poisson statistics applied to this number (or to the number of events actually detected if this is smaller). As in all imaging techniques, the limiting signal contrast required to recognize a morphological structure is constrained by this statistical consideration. The only way to overcome this limit is to increase either the contrast of the measured signal or the number of beam/specimen interactions detected. Unfortunately, these interactions deposit ionizing radiation that may damage the very structure under investigation. As a result, any practical consideration of the high resolution performance of the SEM must consider not only the size of the interaction volume but also the contrast available from the signal producing the image and the radiation sensitivity of the specimen.

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