Analysis of the diffusion layer thickness, equivalent circuit and conductance behaviour for reversible electron transfer processes in linear sweep voltammetry
2004 ◽
Vol 49
(3)
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pp. 445-453
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2004 ◽
Vol 49
(16)
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pp. 2569-2579
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2004 ◽
Vol 387
(4-6)
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pp. 317-321
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Keyword(s):
2019 ◽
Vol 16
(2)
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pp. 026018
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1986 ◽
Vol 19
(10)
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pp. 300-306
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