Atomistic simulations to study crack tip behaviour in multi-elemental alloys

2021 ◽  
Vol 243 ◽  
pp. 107536
Author(s):  
Sandeep Kumar Singh ◽  
Avinash Parashar
Keyword(s):  
Crack Tip ◽  
Atomistic Simulations

Crack tip plasticity in single crystal UO2: Atomistic simulations

2012 ◽  
Vol 430 (1-3) ◽  
pp. 96-105 ◽  
Author(s):  
Yongfeng Zhang ◽  
Xiang-Yang Liu ◽  
Paul C. Millett ◽  
Michael Tonks ◽  
David A. Andersson ◽  
...  
Keyword(s):  
Single Crystal ◽  
Crack Tip ◽  
Atomistic Simulations ◽  
Crack Tip Plasticity

Atomistic simulations to study crack tip behaviour in single crystal of bcc niobium and hcp zirconium

2019 ◽  
Vol 19 (1) ◽  
pp. 37-43 ◽  
Author(s):  
Divya Singh ◽  
Pankaj Sharma ◽  
Sahil Jindal ◽  
Prince Kumar ◽  
Piyush Kumar ◽  
...  
Keyword(s):  
Single Crystal ◽  
Crack Tip ◽  
Atomistic Simulations

Simulation and Contrast Analysis of tem Images of Cracks

1990 ◽  
Vol 48 (1) ◽  
pp. 578-579
Author(s):  
D. Goyal ◽  
A. H. King
Keyword(s):  
Displacement Vector ◽  
Crack Tip ◽  
Perfect Crystal ◽  
Operating Conditions ◽  
Displacement Fields ◽  
Fringe Contrast ◽  
Orthogonal Geometry ◽  
Moire Fringe ◽  
Moiré Fringe

TEM images of cracks have been found to give rise to a moiré fringe type of contrast. It is apparent that the moire fringe contrast is observed because of the presence of a fault in a perfect crystal, and is characteristic of the fault geometry and the diffracting conditions in the TEM. Various studies have reported that the moire fringe contrast observed due to the presence of a crack in an otherwise perfect crystal is distinctive of the mode of crack. This paper describes a technique to study the geometry and mode of the cracks by comparing the images they produce in the TEM because of the effect that their displacement fields have on the diffraction of electrons by the crystal (containing a crack) with the corresponding theoretical images. In order to formulate a means of matching experimental images with theoretical ones, displacement fields of dislocations present (if any) in the vicinity of the crack are not considered, only the effect of the displacement field of the crack is considered.The theoretical images are obtained using a computer program based on the two beam approximation of the dynamical theory of diffraction contrast for an imperfect crystal. The procedures for the determination of the various parameters involved in these computations have been well documented. There are three basic modes of crack. Preliminary studies were carried out considering the simplest form of crack geometries, i. e., mode I, II, III and the mixed modes, with orthogonal crack geometries. It was found that the contrast obtained from each mode is very distinct. The effect of variation of operating conditions such as diffracting vector (), the deviation parameter (ω), the electron beam direction () and the displacement vector were studied. It has been found that any small change in the above parameters can result in a drastic change in the contrast. The most important parameter for the matching of the theoretical and the experimental images was found to be the determination of the geometry of the crack under consideration. In order to be able to simulate the crack image shown in Figure 1, the crack geometry was modified from a orthogonal geometry to one with a crack tip inclined to the original crack front. The variation in the crack tip direction resulted in the variation of the displacement vector also. Figure 1 is a cross-sectional micrograph of a silicon wafer with a chromium film on top, showing a crack in the silicon.

Crack-Tip Singularity Growth Modeling without Remeshing

2016 ◽  
Vol 10 (1) ◽  
pp. 18
Author(s):  
Souad Benkheira ◽  
Y. Abdelaziz
Keyword(s):  
Growth Modeling ◽  
Crack Tip
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