Coupled effect of crystallographic orientation and indenter geometry on nanoindentation of single crystalline copper

A study was carried out to investigate effects of crystallographic structure on the machining performance with polycrystalline oxygen free copper (OFC) using a single crystalline diamond (SCD) micro-tool. The SCD micro-tool used in this study fabricated with a focused ion beam (FIB) has a cutting length of around 30 µm on the primary clearance face. It was found that a change in crystallographic orientation resulted in a variation in machining force, chip thickness and shear angle, leading to a change in machined surface integrity. When a micro-size tool traverses within a grain at a machining direction aligned with a particular crystallographic orientation, the work material in front of the machining tool is found to be severely deformed. If the orientation changes to a less favorable orientation, this may lead to a much reduced shear angle, a thicker chip, striation at the chip back, higher machining forces and a degraded machined surface. This study contributes to the understanding of the physics of micro scale mechanical machining (micro-machining).

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Impact of helium irradiation on the crystallographic orientation change in single-crystalline tungsten

Nuclear Fusion ◽

10.1088/1741-4326/abff04 ◽

2021 ◽

Author(s):

Cuncai Fan ◽

Yutai Katoh ◽

Xunxiang Hu

Keyword(s):

Crystallographic Orientation ◽

Single Crystalline ◽

Orientation Change

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Nanotransplantation Printing of Crystallographic-Orientation-Controlled Single-Crystalline Nanowire Arrays on Diverse Surfaces

ACS Nano ◽

10.1021/acsnano.7b06696 ◽

2017 ◽

Vol 11 (11) ◽

pp. 11642-11652 ◽

Cited By ~ 7

Author(s):

Hyeuk Jin Han ◽

Jae Won Jeong ◽

Se Ryeun Yang ◽

Cheolgyu Kim ◽

Hyeon Gyun Yoo ◽

...

Keyword(s):

Crystallographic Orientation ◽

Nanowire Arrays ◽

Single Crystalline

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“Preparation of Single Crystalline Gold Films for ED Studies”

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100096424 ◽

1972 ◽

Vol 30 ◽

pp. 634-635

Author(s):

Joseph D. C. Peng

Keyword(s):

Crystal Morphology ◽

Diffraction Theory ◽

Scattering Matrix ◽

Vacuum Evaporation ◽

Gold Films ◽

Matrix Formulation ◽

Silver Films ◽

Single Crystalline ◽

Grating Pattern ◽

Stacking Disorder

The relative intensities of the ED spots in a cross-grating pattern can be calculated using N-beam electron diffraction theory. The scattering matrix formulation of N-beam ED theory has been previously applied to imperfect microcrystals of gold containing stacking disorder (coherent twinning) in the (111) crystal plane. In the present experiment an effort has been made to grow single-crystalline, defect-free (111) gold films of a uniform and accurately know thickness using vacuum evaporation techniques. These represent stringent conditions to be met experimentally; however, if a meaningful comparison is to be made between theory and experiment, these factors must be carefully controlled. It is well-known that crystal morphology, perfection, and orientation each have pronounced effects on relative intensities in single crystals.The double evaporation method first suggested by Pashley was employed with some modifications. Oriented silver films of a thickness of about 1500Å were first grown by vacuum evaporation on freshly cleaved mica, with the substrate temperature at 285° C during evaporation with the deposition rate at 500-800Å/sec.

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X-ray microprobe for materials science

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100168013 ◽

1994 ◽

Vol 52 ◽

pp. 56-57

Author(s):

G.E. Ice

Keyword(s):

Crystallographic Orientation ◽

Local Structure ◽

Materials Science ◽

Chemical Information ◽

X Ray Diffraction ◽

Ray Optics ◽

X Ray ◽

Novel Materials ◽

New Information ◽

Elemental Sensitivity

The increasing availability of synchrotron x-ray sources has stimulated the development of advanced hard x-ray (E≥5 keV) microprobes. With new x-ray optics these microprobes can achieve micron and submicron spatial resolutions. The inherent elemental and crystallographic sensitivity of an x-ray microprobe and its inherently nondestructive and penetrating nature will have important applications to materials science. For example, x-ray fluorescent microanalysis of materials can reveal elemental distributions with greater sensitivity than alternative nondestructive probes. In materials, segregation and nonuniform distributions are the rule rather than the exception. Common interfaces to whichsegregation occurs are surfaces, grain and precipitate boundaries, dislocations, and surfaces formed by defects such as vacancy and interstitial configurations. In addition to chemical information, an x-ray diffraction microprobe can reveal the local structure of a material by detecting its phase, crystallographic orientation and strain.Demonstration experiments have already exploited the penetrating nature of an x-ray microprobe and its inherent elemental sensitivity to provide new information about elemental distributions in novel materials.

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