Effects of Crystallographic Structure on Machining Performance with Polycrystalline Oxygen Free Copper by a Single Crystalline Diamond Micro-Tool

2010 ◽  
Vol 447-448 ◽  
pp. 31-35
Author(s):  
X. Ding ◽  
L.C. Lee ◽  
David Lee Butler ◽  
Kah Chuan Shaw
Keyword(s):  
Crystallographic Orientation ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Chip Thickness ◽  
Shear Angle ◽  
Crystallographic Structure ◽  
Machining Performance ◽  
Machined Surface ◽  
Single Crystalline ◽  
Micro Tool

A study was carried out to investigate effects of crystallographic structure on the machining performance with polycrystalline oxygen free copper (OFC) using a single crystalline diamond (SCD) micro-tool. The SCD micro-tool used in this study fabricated with a focused ion beam (FIB) has a cutting length of around 30 µm on the primary clearance face. It was found that a change in crystallographic orientation resulted in a variation in machining force, chip thickness and shear angle, leading to a change in machined surface integrity. When a micro-size tool traverses within a grain at a machining direction aligned with a particular crystallographic orientation, the work material in front of the machining tool is found to be severely deformed. If the orientation changes to a less favorable orientation, this may lead to a much reduced shear angle, a thicker chip, striation at the chip back, higher machining forces and a degraded machined surface. This study contributes to the understanding of the physics of micro scale mechanical machining (micro-machining).

scholarly journals An Experiment-Based Profile Function for the Calculation of Damage Distribution in Bulk Silicon Induced by a Helium Focused Ion Beam Process

Sensors ◽  
2020 ◽  
Vol 20 (8) ◽  
pp. 2306 ◽  
Author(s):  
Qianhuang Chen ◽  
Tianyang Shao ◽  
Yan Xing
Keyword(s):  
Beam Energy ◽  
Focused Ion Beam ◽  
Crystalline Silicon ◽  
Ion Beam ◽  
Single Crystalline Silicon ◽  
Nanostructure Fabrication ◽  
Profile Function ◽  
Single Crystalline ◽  
Prediction Function ◽  
Wide Range

The helium focused ion beam (He-FIB) is widely used in the field of nanostructure fabrication due to its high resolution. Complicated forms of processing damage induced by He-FIB can be observed in substrates, and these damages have a severe impact on nanostructure processing. This study experimentally investigated the influence of the beam energy and ion dose of He-FIB on processing damage. Based on the experimental results, a prediction function for the amorphous damage profile of the single-crystalline silicon substrate caused by incident He-FIB was proposed, and a method for calculating the amorphous damage profile by inputting ion dose and beam energy was established. Based on one set of the amorphous damage profiles, the function coefficients were determined using a genetic algorithm. Experiments on single-crystalline silicon scanned by He-FIB under different process parameters were carried out to validate the model. The proposed experiment-based model can accurately predict the amorphous damage profile induced by He-FIB under a wide range of different ion doses and beam energies.

Effects of P Content on Morphology of Nanocrystals Induced by FIB Irradiation in Ni-P Amorphous Alloy

2006 ◽  
Vol 960 ◽  
Author(s):  
Koji Sato ◽  
Chiemi Ishiyama ◽  
Masato Sone ◽  
Yakichi Higo
Keyword(s):  
Thin Films ◽  
Amorphous Alloy ◽  
Crystallographic Orientation ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Orientation Relationships ◽  
Beam Direction ◽  
Precipitation Distribution ◽  
P Content

ABSTRACTWe studied the effects of phosphorus (P) on Ni nanocrystalline morphology formed by focused ion beam (FIB) irradiation for Ni-P amorphous alloy thin films. The P content in the amorphous alloy was varied from 8 to 12 wt.%. The nanocrystals induced by the FIB irradiation for Ni-11.8, 8.9, 7.9 wt.% amorphous alloy had an f.c.c. structure and showed unique crystallographic orientation relationships to the geometry of the focused ion beam, that is, {111}f.c.c. parallel to the irradiated plane and <110>f.c.c. parallel to the projected ion beam direction, respectively. The Ni nanocrystals precipitated like aggregates with decreasing of the P content. These results represent that the P content does not affect crystallographic orientation relationships, while influences the precipitation distribution of Ni nanocrystals generated by the FIB irradiation.

Development and machining performance of a textured diamond cutting tool fabricated with a focused ion beam and heat treatment

2017 ◽  
Vol 47 ◽  
pp. 311-320 ◽  
Author(s):  
Noritaka Kawasegi ◽  
Kazuma Ozaki ◽  
Noboru Morita ◽  
Kazuhito Nishimura ◽  
Makoto Yamaguchi
Keyword(s):  
Heat Treatment ◽  
Focused Ion Beam ◽  
Cutting Tool ◽  
Ion Beam ◽  
Machining Performance ◽  
Diamond Cutting ◽  
Diamond Cutting Tool

Fracture strength analysis of single-crystalline silicon cantilevers processed by focused ion beam

2014 ◽  
Vol 206 ◽  
pp. 81-87 ◽  
Author(s):  
Yoshimasa Takahashi ◽  
Hikaru Kondo ◽  
Hironobu Niimi ◽  
Takeshi Nokuo ◽  
Toshiaki Suzuki
Keyword(s):  
Fracture Strength ◽  
Focused Ion Beam ◽  
Crystalline Silicon ◽  
Ion Beam ◽  
Strength Analysis ◽  
Single Crystalline Silicon ◽  
Single Crystalline

Removal of Ion Irradiation-Induced Affected Layers from Diamond Cutting Tools to Improve Machining Performance

2014 ◽  
Vol 1017 ◽  
pp. 479-484
Author(s):  
Noritaka Kawasegi ◽  
Kazuma Ozaki ◽  
Noboru Morita ◽  
Kazuhito Nishimura ◽  
Hideki Sasaoka
Keyword(s):  
Focused Ion Beam ◽  
Ion Irradiation ◽  
Ion Beam ◽  
Effective Means ◽  
Cutting Tools ◽  
Machining Performance ◽  
Diamond Cutting ◽  
Diamond Tools ◽  
Tool Performance ◽  
Diamond Cutting Tools

A focused ion beam (FIB) is an effective means of fabricating micro-to submicro-scale shapes on diamond cutting tools. However, ion irradiation of diamond tools causes ion implantation, defects, and non-diamond phases, all of which degrade the tool performance. To remove affected layers from FIB-irradiated diamond tools, heat treatment in air was applied, and the effect of the heating parameters on the etchability of the irradiated area was investigated. It was found that the affected layer could be etched and removed from the diamond tool surface, even at 500 °C. In machining experiments on aluminum alloy and nickel phosphorus, machining performance was improved by the applied heating technique, and the cutting forces and machined surfaces were similar to those obtained with the non-irradiated tool. These results indicate that the proposed heating technique is effective for diamond cutting tools shaped by FIB.

Crystallographic Orientation Relationship between Discontinuous Precipitates and the Matrix in AM-Series Alloys

2011 ◽  
Vol 409 ◽  
pp. 383-386 ◽  
Author(s):  
Katsumi Watanabe ◽  
Kenji Matsuda ◽  
Tokimasa Kawabata ◽  
Susumu Ikeno
Keyword(s):  
Orientation Relationship ◽  
Magnesium Alloys ◽  
Crystallographic Orientation ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Hardness Measurement ◽  
Electron Backscattered Diffraction ◽  
The Matrix ◽  
Crystallographic Orientation Relationship ◽  
The Relationship

Magnesium alloys have received considerable attention because of their lightweight and recyclability. AM-series and AZ-series Mg-Al alloys have been used for industrial products widely, particularly for AM-series alloys because of better toughness and impact absorption properties than AZ-series alloys. The Mg17Al12intermetallic compound is the only precipitate formed during ageing after the solution heart treatment. Discontinuous precipitates exist in grain boundary randomly, and continuous precipitates exist in the matrix. However, there is few report about the orientation relationship between the discontinuous precipitates and the matrix. The purpose of this study is to investigate the orientation relationship between the discontinuous precipitates and the matrix of AM-series magnesium alloys. Hardness measurement, SEM observation, the electron backscattered diffraction (EBSD) techniques were preformed in order to understand the relationship between the discontinuous precipitate and crystallographic orientation of grains in AM-series magnesium alloy. TEM samples with discontinuous precipitates were prepared using the focused ion beam (FIB). And TEM observation was performed to investigate the discontinuous precipitates and crystallographic orientation in the matrix.

scholarly journals Surface Evolution during Focused Ion Beam Micro-Machining in (001) Plane of Single-Crystalline Ni and Amorphous Nickel Alloy

2005 ◽  
Vol 46 (10) ◽  
pp. 2295-2297 ◽  
Author(s):  
Hiroyuki Hosokawa ◽  
Takeshi Nakajima ◽  
Koji Shimojima ◽  
Mamoru Mabuchi
Keyword(s):  
Nickel Alloy ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Micro Machining ◽  
Surface Evolution ◽  
Single Crystalline
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