The effect of reverse straining on the microstructure, texture, and hardness of the pure Al during the single cycle of the simple shear extrusion (SSE) process is investigated. Electron backscattering diffraction (EBSD), transmission electron microscopy (TEM), and scanning transmission electron microscopy (STEM) are used for microstructural evaluations. Due to the nature of the SSE process, the direction of the shear is reversed in the second half channel. As a result, the mean misorientation angle, dislocation density, and hardness decrease. The grain size increases to some extent in the exit of the channel compared with that in the middle. The structural evolution during the single pass of SSE is described in terms of the dislocation cancelling, “untangling” of the cell walls and disintegration of the “forward” cell structure due to the reverse straining in the second half channel. Some simple shear components replace the first texture component in the middle of the channel. At the exit of the channel, the primary texture components appear somewhat confirming the strain reversal effect in the second half channel.
Modeling the effect of strain reversal on grain refinement and crystallographic texture during simple shear extrusion
