Magnetic domain reversal induced by thermal activation in SmCo alloy

2021 ◽  
pp. 162684
Author(s):  
Zhihe Zhao ◽  
Jiangtao Zhao ◽  
Mingkun Wang ◽  
Weixing Xia ◽  
Zhenlong Chao ◽  
...  
Keyword(s):  
Thermal Activation ◽  
Magnetic Domain ◽  
Domain Reversal

Magnetic domain reversal in ultrathin Co(001) films probed by giant magnetoresistance measurements

2000 ◽  
Vol 61 (10) ◽  
pp. 6871-6875 ◽  
Author(s):  
S. P. Li ◽  
A. Samad ◽  
W. S. Lew ◽  
Y. B. Xu ◽  
J. A. C. Bland
Keyword(s):  
Giant Magnetoresistance ◽  
Magnetic Domain ◽  
Domain Reversal

Magnetic domain reversal behavior for various patterned hole depths

2005 ◽  
Vol 41 (2) ◽  
pp. 950-952 ◽  
Author(s):  
Te-Ho Wu ◽  
L.X. Ye ◽  
Chun-Shin Yeh ◽  
Y.W. Huang ◽  
Bohr-Ran Huang ◽  
...  
Keyword(s):  
Magnetic Domain ◽  
Domain Reversal

Analysis Interaction Field Strength and Spectrum from Microhysteresis Loops

2007 ◽  
Vol 998 ◽  
Author(s):  
Lin-Xiu Ye ◽  
Jia-Mou Lee ◽  
Te-ho Wu
Keyword(s):  
Experimental Data ◽  
Field Strength ◽  
Direct Method ◽  
Magnetic Domain ◽  
Magnetic Thin Films ◽  
Interaction Field ◽  
Field Distributions ◽  
Reversal Mechanism ◽  
A Direct Method ◽  
Domain Reversal

ABSTRACTIn this paper, we present a direct method to analyze the mechanism of magnetic domain reversal for a series of amorphous Dyx(FeCo)1-x magnetic thin films and whereby we obtained the distributions of the coercivities and interaction fields from 90,000 measurements of the microhysteresis loops. The standard deviations of the coercivity and the interaction field distributions, σi and σk, can be estimated by fitting the experimental data with the Gaussian- Preisach function. The results show that the interaction field decreases as Dy composition approaches the compensation point. The reversal mechanism is dominated by nucleation when σi is smaller than σk. The relationships between the magnetization reversal and interaction field strength are discussed

scholarly journals 100-nm-sized magnetic domain reversal by the magneto-electric effect in self-assembled BiFeO3/CoFe2O4 bilayer films

2015 ◽  
Vol 5 (1) ◽  
Author(s):  
Keita Sone ◽  
Hiroshi Naganuma ◽  
Masaki Ito ◽  
Takamichi Miyazaki ◽  
Takashi Nakajima ◽  
...  
Keyword(s):  
Magnetic Domain ◽  
Bilayer Films ◽  
Self Assembled ◽  
Electric Effect ◽  
Domain Reversal

Evolution of magnetic domain reversal with temperature inCo∕Ptmultilayers observed by magneto-optical Kerr imaging

2007 ◽  
Vol 76 (18) ◽  
Author(s):  
X. P. Xie ◽  
X. W. Zhao ◽  
J. W. Knepper ◽  
F. Y. Yang ◽  
R. Sooryakumar
Keyword(s):  
Magnetic Domain ◽  
Kerr Imaging ◽  
Domain Reversal

The direct determination of magnetic domain wall profiles using a split detector STEM

1978 ◽  
Vol 36 (1) ◽  
pp. 466-467
Author(s):  
J.N. Chapman ◽  
P.E. Batson ◽  
E.M. Waddell ◽  
R.P. Ferrier
Keyword(s):  
Electron Microscope ◽  
Domain Wall ◽  
Transmission Electron Microscope ◽  
Domain Walls ◽  
Photographic Plate ◽  
Magnetic Domain ◽  
Direct Determination ◽  
Quantitative Information ◽  
Scanning Transmission Electron Microscope ◽  
Transmission Electron

By far the most commonly used mode of Lorentz microscopy in the examination of ferromagnetic thin films is the Fresnel or defocus mode. Use of this mode in the conventional transmission electron microscope (CTEM) is straightforward and immediately reveals the existence of all domain walls present. However, if such quantitative information as the domain wall profile is required, the technique suffers from several disadvantages. These include the inability to directly observe fine image detail on the viewing screen because of the stringent illumination coherence requirements, the difficulty of accurately translating part of a photographic plate into quantitative electron intensity data, and, perhaps most severe, the difficulty of interpreting this data. One solution to the first-named problem is to use a CTEM equipped with a field emission gun (FEG) (Inoue, Harada and Yamamoto 1977) whilst a second is to use the equivalent mode of image formation in a scanning transmission electron microscope (STEM) (Chapman, Batson, Waddell, Ferrier and Craven 1977), a technique which largely overcomes the second-named problem as well.

Lorentz microscopy study of magnetic domain walls in Fe-Cr-Co alloys

1978 ◽  
Vol 36 (1) ◽  
pp. 462-463
Author(s):  
Yalcin Belli
Keyword(s):  
Domain Walls ◽  
Magnetic Domain ◽  
Microscopy Study ◽  
Ferromagnetic Phase ◽  
Stable Phase ◽  
Magnetic Domains ◽  
Lorentz Microscopy ◽  
Magnetic Hardening ◽  
Electron Microscopes ◽  
Co Alloys

Fe-Cr-Co alloys have great technological potential to replace Alnico alloys as hard magnets. The relationship between the microstructures and the magnetic properties has been recently established for some of these alloys. The magnetic hardening has been attributed to the decomposition of the high temperature stable phase (α) into an elongated Fe-rich ferromagnetic phase (α1) and a weakly magnetic or non-magnetic Cr-rich phase (α2). The relationships between magnetic domains and domain walls and these different phases are yet to be understood. The TEM has been used to ascertain the mechanism of magnetic hardening for the first time in these alloys. The present paper describes the magnetic domain structure and the magnetization reversal processes in some of these multiphase materials. Microstructures to change properties resulting from, (i) isothermal aging, (ii) thermomagnetic treatment (TMT) and (iii) TMT + stepaging have been chosen for this investigation. The Jem-7A and Philips EM-301 transmission electron microscopes operating at 100 kV have been used for the Lorentz microscopy study of the magnetic domains and their interactions with the finely dispersed precipitate phases.

Magnetic Material Observation Assembly for Tem with a Eucentric Goniometer

1976 ◽  
Vol 34 ◽  
pp. 540-541
Author(s):  
K. Shi rota ◽  
A. Yonezawa ◽  
K. Shibatomi ◽  
T. Yanaka
Keyword(s):  
Magnetic Material ◽  
Electron Microscope ◽  
Magnetic Domain ◽  
Objective Lens ◽  
Magnetic Domains ◽  
Lorentz Microscopy ◽  
Transmission Electron ◽  
Correction Of Astigmatism ◽  
Single Orientation ◽  
Conventional Transmission Electron Microscope

As is well known, it is not so easy to operate a conventional transmission electron microscope for observation of magnetic materials. The reason is that the instrument requires re-alignment of the axis and re-correction of astigmatism after each specimen shift, as the lens field is greatly disturbed by the specimen. With a conventional electron microscope, furthermore, it is impossible to observe magnetic domains, because the specimen is magnetized to single orientation by the lens field. The above mentioned facts are due to the specimen usually being in the lens field. Thus, special techniques or systems are usually required for magnetic material observation (especially magnetic domain observation), for example, the technique to switch off the objective lens current and Lorentz microscopy. But these cannot give high image quality and wide magnification range, and furthermore Lorentz microscopy is very complicated.

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