Selective wet-etching and characterization of chalcogenide thin films in inorganic alkaline solutions

2007 ◽  
Vol 353 (13-15) ◽  
pp. 1441-1445 ◽  
Author(s):  
J. Orava ◽  
T. Wagner ◽  
M. Krbal ◽  
T. Kohoutek ◽  
Mil. Vlcek ◽  
...  
Keyword(s):  
Thin Films ◽  
Wet Etching ◽  
Alkaline Solutions ◽  
Chalcogenide Thin Films

Preparation and characterization of laser-ablated multicomponent chalcogenide thin films

1990 ◽  
Vol 5 (3) ◽  
pp. 511-514 ◽  
Author(s):  
Didarul Islam ◽  
C. E. Brient ◽  
R. L. Cappelletti
Keyword(s):  
Thin Films ◽  
Laser Ablation ◽  
Thermal Evaporation ◽  
Analytical Techniques ◽  
X Rays ◽  
Single Source ◽  
X Ray ◽  
Chalcogenide Thin Films ◽  
Scanning Electron

The preparation of multicomponent chalcogenide glassy thin films from bulk targets by laser ablation is described. The film stoichiometries are characterized by proton-induced x-ray emission (PIXE). Compared to single source thermal evaporation, laser ablation is found to preserve starting stoichiometries in the resulting thin films far more accurately. Thermally evaporated films were studied both by PIXE and by energy dispersed x rays (EDX) produced in a scanning electron microscope, and the results of these two analytical techniques compare well.

Structural, Morphological and Optical Characterization of X80Y10Cu10 and Y80X10Cu10 (X = Se, Y,Te) Chalcogenide Thin Films

2018 ◽  
Vol 5 (3) ◽  
pp. 9156-9160
Author(s):  
Pramesh Chandra ◽  
Arvind Kumar Verma ◽  
R.K. Shukla ◽  
Anchal Srivastava
Keyword(s):  
Thin Films ◽  
Optical Characterization ◽  
Chalcogenide Thin Films

Preparation and characterization of indium chalcogenide thin films: A material for phase change memory

2018 ◽  
Vol 449 ◽  
pp. 55-67 ◽  
Author(s):  
M. Pandian ◽  
P. Matheswaran ◽  
B. Gokul ◽  
R. Sathyamoorthy ◽  
K. Asokan
Keyword(s):  
Thin Films ◽  
Phase Change ◽  
Phase Change Memory ◽  
Chalcogenide Thin Films ◽  
Change Memory

Comparison of dispersion models in the optical characterization of As–S chalcogenide thin films

2006 ◽  
Vol 352 (52-54) ◽  
pp. 5633-5641 ◽  
Author(s):  
Ivan Ohlídal ◽  
Daniel Franta ◽  
Martin Šiler ◽  
František Vižd’a ◽  
Miloslav Frumar ◽  
...  
Keyword(s):  
Thin Films ◽  
Optical Characterization ◽  
Dispersion Models ◽  
Chalcogenide Thin Films
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