Reversible phase transformations in a shape memory alloy In–Tl nanowires observed by in situ transmission electron microscopy

2012 ◽  
Vol 70 ◽  
pp. 109-112 ◽  
Author(s):  
Hongxing Zheng ◽  
Zhiping Luo ◽  
Dong Fang ◽  
Francis R. Phillips ◽  
Dimitris C. Lagoudas
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Shape Memory Alloy ◽  
Shape Memory ◽  
Phase Transformations ◽  
Transmission Electron ◽  
Reversible Phase

In situ Transmission Electron Microscopy and Nanoindentation Studies of Phase Transformation and Pseudoelasticity of Shape-memory Titanium-nickel Films

2005 ◽  
Vol 20 (7) ◽  
pp. 1808-1813 ◽  
Author(s):  
X.-G. Ma ◽  
K. Komvopoulos
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Phase Transformation ◽  
Shape Memory ◽  
Heating And Cooling ◽  
Transmission Electron ◽  
Different Temperatures ◽  
Titanium Nickel ◽  
In Situ Heating

Transmission electron microscopy (TEM) and nanoindentation, both with in situ heating capability, and electrical resistivity measurements were used to investigate phase transformation phenomena and thermomechanical behavior of shape-memory titanium-nickel (TiNi) films. The mechanisms responsible for phase transformation in the nearly equiatomic TiNi films were revealed by heating and cooling the samples inside the TEM vacuum chamber. Insight into the deformation behavior of the TiNi films was obtained from the nanoindentation response at different temperatures. A transition from elastic-plastic to pseudoelastic deformation of the martensitic TiNi films was encountered during indentation and heating. In contrast to the traditional belief, the martensitic TiNi films exhibited a pseudoelastic behavior during nanoindentation within a specific temperature range. This unexpected behavior is interpreted in terms of the evolution of martensitic variants and changes in the mobility of the twinned structures in the martensitic TiNi films, observed with the TEM during in situ heating.

Analysis of Interface Dynamics in Solid-State Phase Transformations by In Situ Hot-Stage High-Resolution Transmission Electron Microscopy

1994 ◽  
Vol 332 ◽  
Author(s):  
James M. Howe ◽  
W. E. Benson ◽  
A. Garg ◽  
Y.-C. Chang
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Solid State ◽  
High Resolution ◽  
Phase Transformations ◽  
Interface Motion ◽  
Transmission Electron ◽  
Kinetics Of ◽  
Dynamics Of Interfaces

ABSTRACTIn situ hot-stage high-resolution transmission electron microscopy (HRTEM) provides unique capabilities for quantifying the dynamics of interfaces at the atomic level. Such information is critical for understanding the theory of interfaces and solid-state phase transformations. This paper provides a brief description of particular requirements for performing in situ hot-stage HRTEM, summarizes different types of in situ HRTEM investigations and illustrates the use of this technique to obtain quantitative data on the atomic mechanisms and kinetics of interface motion in precipitation, crystallization and martensitic reactions. Some limitations of in situ hot-stage HRTEM and future prospects of this technique are also discussed.

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