Improved Calibration Technique for Two-Probe Setup to Enhance Its In-Circuit Impedance Measurement Accuracy

Measurement ◽  
2021 ◽  
pp. 110007
Author(s):  
Zhenyu Zhao ◽  
Arjuna Weerasinghe ◽  
Quqin Sun ◽  
Fei Fan ◽  
Kye Yak
Keyword(s):  
Measurement Accuracy ◽  
Impedance Measurement ◽  
Calibration Technique ◽  
Circuit Impedance

Short-circuit impedance measurement

2003 ◽  
Vol 150 (2) ◽  
pp. 169 ◽  
Author(s):  
K.O.H. Pedersen ◽  
A.H. Nielsen ◽  
N.K. Poulsen
Keyword(s):  
Short Circuit ◽  
Impedance Measurement ◽  
Circuit Impedance

Impact of calibration technique on measurement accuracy for the JET core charge-exchange system

2008 ◽  
Vol 79 (10) ◽  
pp. 10F525 ◽  
Author(s):  
Carine Giroud ◽  
A. G. Meigs ◽  
C. R. Negus ◽  
K.-D. Zastrow ◽  
T. M. Biewer ◽  
...  
Keyword(s):  
Charge Exchange ◽  
Measurement Accuracy ◽  
Exchange System ◽  
Calibration Technique

scholarly journals An Improved Calibration Technique for MEMS Accelerometer-Based Inclinometers

Sensors ◽  
2020 ◽  
Vol 20 (2) ◽  
pp. 452 ◽  
Author(s):  
Jiaxin Zhu ◽  
Weifeng Wang ◽  
Shiping Huang ◽  
Wei Ding
Keyword(s):  
Measurement Accuracy ◽  
Micro Electro Mechanical System ◽  
Calibration Model ◽  
Beam Model ◽  
Parameter Calibration ◽  
Calibration Technique ◽  
Civil Structures ◽  
Mems Accelerometer ◽  
Validation Experiment ◽  
Key Parameter

Micro-electro-mechanical system (MEMS) accelerometer-based inclinometers are widely used to measure deformations of civil structures. To further improve the measurement accuracy, a new calibration technique was proposed in this paper. First, a single-parameter calibration model was constructed to obtain accurate angles. Then, an image-processing-based method was designed to obtain the key parameter for the calibration model. An ADXL355 accelerometer-based inclinometer was calibrated to evaluate the feasibility of the technique. In this validation experiment, the technique was proven to be reliable and robust. Finally, to evaluate the performance of the technique, the calibrated MEMS inclinometer was used to measure the deflections of a scale beam model. The experimental results demonstrate that the proposed technique can yield accurate deformation measurements for MEMS inclinometers.

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