A method to enhance the measurement accuracy of Raman shift based on high precision calibration technique

2016 ◽  
Author(s):  
Xiang Ding ◽  
Fei Li ◽  
Jiyan Zhang ◽  
Wenli Liu
2012 ◽  
Vol 10 (7) ◽  
pp. 072901-72904 ◽  
Author(s):  
Jiacheng Hu Jiacheng Hu ◽  
Fuchang Chen Fuchang Chen ◽  
Chengtao Zhang Chengtao Zhang ◽  
Zunqi Lin Zunqi Lin

2016 ◽  
Vol 679 ◽  
pp. 129-134
Author(s):  
Wan Duo Wu ◽  
Qiang Xian Huang ◽  
Chao Qun Wang ◽  
Ting Ting Wu ◽  
Hong Xie

The technique utilizing single-frequency laser interferometry has very high measurement accuracy, but it has rigorous requirements for optical design which is affected by many factors. In order to achieve single-frequency laser interferometry with large stroke and high precision, the integral layout, the polarization phase shifting technique and the common mode rejection method are adopted to design the length interferometry system. This paper analyzes factors and design requirements which affect measurement accuracy with large stroke. Based on polarization phase shifting technique, the system employs the four-beam-signal detection technique and the common mode rejection method, to make a differential processing of four mutually orthogonal signals. Thus, the influences of zero-drift of intensity and environmental change on system are reduced. Combined with a 200 phase subdivision, the system achieves the resolution with 0.8 nm. Under the VC++ environment, the displacement measurement results are compensated and corrected according to the environmental parameters. Compared with the Renishaw XL-80 laser interferometer, the system has better stability in short term. In the measuring range of 60 mm, the effectiveness of the system is verified.


2008 ◽  
Vol 79 (10) ◽  
pp. 10F525 ◽  
Author(s):  
Carine Giroud ◽  
A. G. Meigs ◽  
C. R. Negus ◽  
K.-D. Zastrow ◽  
T. M. Biewer ◽  
...  

2019 ◽  
Vol 1 (2) ◽  
pp. 32-38
Author(s):  
Adolf Malkov ◽  
Roman Bryskin

This article describes the method of creating a high-rise basis for solving various engineering problems by geometric leveling. The description, disadvantages and advantages of the existing methods of geometric leveling are given. The requirements for measurement accuracy in geometric leveling are presented. The authors propose a method of controling the measurement of excess at the leveling station using a crutch with two heads offset relative to each other by a fixed value. The practical step-by-step implementation of this method of geometric leveling is presented. The basic formulas used to obtain the measurement results are described.


2010 ◽  
Vol 164 ◽  
pp. 19-24
Author(s):  
Tatjana Ivanova ◽  
Janis Rudzitis

High-precision mass measurement equipment is required in some areas of science and technology. Physics, chemistry, pharmaceutics and high precision mechanics are common examples. In metrology, high-precision scales are used for verification and calibration of lower precision mass measurement equipment (weights and scales). Mass comparators are the most accurate mass measurement instruments available today. It is a special type of electronic scales designed to compare mass of two weights. They can be automatic or manual, with various measurement ranges and accuracy classes. This article discusses principles of operation of mass comparators and practice of high-precision mass measurement. There are special computer programs that can be used in conjunction with these instruments, which may significantly improve measurement accuracy (when mass comparator is controlled remotely) as well as simplify calculations and reporting procedures. This article describes one of these programs – ScalesNet32 – which can be used with mass comparators produced by Sartorius (Germany).


Sensors ◽  
2020 ◽  
Vol 20 (2) ◽  
pp. 452 ◽  
Author(s):  
Jiaxin Zhu ◽  
Weifeng Wang ◽  
Shiping Huang ◽  
Wei Ding

Micro-electro-mechanical system (MEMS) accelerometer-based inclinometers are widely used to measure deformations of civil structures. To further improve the measurement accuracy, a new calibration technique was proposed in this paper. First, a single-parameter calibration model was constructed to obtain accurate angles. Then, an image-processing-based method was designed to obtain the key parameter for the calibration model. An ADXL355 accelerometer-based inclinometer was calibrated to evaluate the feasibility of the technique. In this validation experiment, the technique was proven to be reliable and robust. Finally, to evaluate the performance of the technique, the calibrated MEMS inclinometer was used to measure the deflections of a scale beam model. The experimental results demonstrate that the proposed technique can yield accurate deformation measurements for MEMS inclinometers.


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