The role of dislocations in γ-iPP under plastic deformation investigated by X-ray line profile analysis

2013 ◽  
Vol 67 ◽  
pp. 126-132 ◽  
Author(s):  
G. Polt ◽  
F. Spieckermann ◽  
H. Wilhelm ◽  
M.B. Kerber ◽  
E. Schafler ◽  
...  
Keyword(s):  
Plastic Deformation ◽  
Line Profile ◽  
Profile Analysis ◽  
Line Profile Analysis ◽  
X Ray

The role of dislocations for the plastic deformation of semicrystalline polymers as investigated by multireflection X-ray line profile analysis

2012 ◽  
Vol 125 (6) ◽  
pp. 4150-4154 ◽  
Author(s):  
Florian Spieckermann ◽  
Gerald Polt ◽  
Harald Wilhelm ◽  
Michael Kerber ◽  
Erhard Schafler ◽  
...  
Keyword(s):  
Plastic Deformation ◽  
Line Profile ◽  
Profile Analysis ◽  
Semicrystalline Polymers ◽  
Line Profile Analysis ◽  
X Ray

Subgrain Size-Distributions, Dislocation Structures, Stacking- and Twin Faults and Vacancy Concentrations in SPD Materials Determined by X-Ray Line Profile Analysis

2006 ◽  
Vol 503-504 ◽  
pp. 133-140 ◽  
Author(s):  
Tamás Ungár
Keyword(s):  
Plastic Deformation ◽  
Line Profile ◽  
Profile Analysis ◽  
Subgrain Size ◽  
Stacking Faults ◽  
Line Profile Analysis ◽  
Size Distributions ◽  
X Ray ◽  
The Status ◽  
Vacancy Concentrations

The fundamentals of X-ray line profile analysis are summarised in terms of subgrain size and size-distribution, dislocation density and dislocation types, especially edge and screw dislocations, intrinsic and extrinsic stacking faults and twin boundaries and vacancies produced during plastic deformation. It is shown that deformation induced vacancy concentrations in the grain boundaries of compressed copper polycrystals are close to the equilibrium values at the melting temperature. The discrepancy between X-ray and TEM size values is discussed in terms subgrain- and grain size. It is shown that this apparent discrepancy might be used to determine the status of fragmentation by severe plastic deformation.

Microstructure of post-deformed ECAP-Ti investigated by Multiple X-Ray Line Profile Analysis

2006 ◽  
Vol 2006 (suppl_23_2006) ◽  
pp. 129-134 ◽  
Author(s):  
E. Schafler ◽  
K. Nyilas ◽  
S. Bernstorff ◽  
L. Zeipper ◽  
M. Zehetbauer ◽  
...  
Keyword(s):  
Line Profile ◽  
Profile Analysis ◽  
Line Profile Analysis ◽  
X Ray

scholarly journals X-ray line profile analysis in alakali-treated ramie fiber

2003 ◽  
Vol 60 (6) ◽  
pp. 919-922 ◽  
Author(s):  
K. P. Sao ◽  
B. K. Samantaray ◽  
S. Bhattacherjee
Keyword(s):  
Line Profile ◽  
Profile Analysis ◽  
Ramie Fiber ◽  
Line Profile Analysis ◽  
X Ray
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