Automatic full quantum analysis of CV measurements for bulk and SOI devices

2011 ◽  
Vol 88 (12) ◽  
pp. 3404-3406 ◽  
Author(s):  
M. Charbonnier ◽  
C. Leroux ◽  
F. Allain ◽  
A. Toffoli ◽  
G. Ghibaudo ◽  
...  
2020 ◽  
Vol 14 (1) ◽  
pp. 91-98
Author(s):  
Fatemeh Ahmadinouri ◽  
Mehdi Hosseini ◽  
Farrokh Sarreshtedari ◽  
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...  

2007 ◽  
Vol 84 (9-10) ◽  
pp. 2408-2411 ◽  
Author(s):  
C. Leroux ◽  
F. Allain ◽  
A. Toffoli ◽  
G. Ghibaudo ◽  
G. Reimbold

2020 ◽  
Vol 23 (3) ◽  
pp. 227-252
Author(s):  
T.E. Rudenko ◽  
◽  
A.N. Nazarov ◽  
V.S. Lysenko ◽  
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...  

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