Improvement of current sensitivity in detecting current-induced magnetic field using magnetic force microscopy

2011 ◽  
Vol 88 (8) ◽  
pp. 2778-2780 ◽  
Author(s):  
F. Wakaya ◽  
M. Kajiwara ◽  
K. Kubo ◽  
S. Abo ◽  
M. Takai
Keyword(s):  
Magnetic Field ◽  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Induced Magnetic Field ◽  
Current Sensitivity ◽  
Force Microscopy

Investigation of Spatial Resolution in Current-Induced Magnetic Field Detection by Magnetic Force Microscopy

2005 ◽  
Vol 44 (12) ◽  
pp. 8625-8629 ◽  
Author(s):  
Daisuke Saida ◽  
Tomohiko Edura ◽  
Ken Tsutsui ◽  
Yasuo Wada ◽  
Takuji Takahashi
Keyword(s):  
Magnetic Field ◽  
Spatial Resolution ◽  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Induced Magnetic Field ◽  
Field Detection ◽  
Force Microscopy

Study of MFM Application in Semiconductor Failure Analysis

2004 ◽  
Author(s):  
Way-Jam Chen ◽  
Lily Shiau ◽  
Ming-Ching Huang ◽  
Chia-Hsing Chao
Keyword(s):  
Magnetic Field ◽  
Failure Analysis ◽  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Current Flow ◽  
Force Microscopy ◽  
The Magnetic Field ◽  
A Current

Abstract In this study we have investigated the magnetic field associated with a current flowing in a circuit using Magnetic Force Microscopy (MFM). The technique is able to identify the magnetic field associated with a current flow and has potential for failure analysis.

scholarly journals Artifacts in magnetic force microscopy under in-plane applied magnetic field: Magnetic bubble as a case study

2020 ◽  
Vol 500 ◽  
pp. 166296
Author(s):  
Ibrahim Cinar ◽  
Daniel Lacour ◽  
Francois Montaigne ◽  
Vito Puliafito ◽  
Sebastien Petit Watelot ◽  
...  
Keyword(s):  
Magnetic Field ◽  
Applied Magnetic Field ◽  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Magnetic Bubble ◽  
Force Microscopy

scholarly journals Round robin comparison on quantitative nanometer scale magnetic field measurements by magnetic force microscopy

2020 ◽  
Vol 511 ◽  
pp. 166947
Author(s):  
Xiukun Hu ◽  
Gaoliang Dai ◽  
Sibylle Sievers ◽  
Alexander Fernández-Scarioni ◽  
Héctor Corte-León ◽  
...  
Keyword(s):  
Magnetic Field ◽  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Field Measurements ◽  
Round Robin ◽  
Nanometer Scale ◽  
Force Microscopy ◽  
Magnetic Field Measurements
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