Local Probing of Magnetization Reversal in a Ni-Fe Nanowire with a Notch Measured with Magnetic Field Sweeping(MFS)-Magnetic Force Microscopy(MFM)

2009 ◽  
Author(s):  
Y. Endo ◽  
Y. Mitsuzuka ◽  
M. Watanabe ◽  
M. Yamaguchi
2007 ◽  
Vol 46 (No. 37) ◽  
pp. L898-L900 ◽  
Author(s):  
Yasushi Endo ◽  
Yusuke Matsumura ◽  
Hideki Fujimoto ◽  
Ryoichi Nakatani ◽  
Masahiko Yamamoto

Author(s):  
Way-Jam Chen ◽  
Lily Shiau ◽  
Ming-Ching Huang ◽  
Chia-Hsing Chao

Abstract In this study we have investigated the magnetic field associated with a current flowing in a circuit using Magnetic Force Microscopy (MFM). The technique is able to identify the magnetic field associated with a current flow and has potential for failure analysis.


2020 ◽  
Vol 500 ◽  
pp. 166296
Author(s):  
Ibrahim Cinar ◽  
Daniel Lacour ◽  
Francois Montaigne ◽  
Vito Puliafito ◽  
Sebastien Petit Watelot ◽  
...  

2020 ◽  
Vol 511 ◽  
pp. 166947
Author(s):  
Xiukun Hu ◽  
Gaoliang Dai ◽  
Sibylle Sievers ◽  
Alexander Fernández-Scarioni ◽  
Héctor Corte-León ◽  
...  

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