Influence of aluminum concentration and substrate temperature on the physical characteristics of chemically sprayed ZnO: Al thin solid films deposited from zinc pentanedionate and aluminum pentanedionate

2010 ◽  
Vol 13 (2) ◽  
pp. 80-85 ◽  
Author(s):  
L. Castañeda ◽  
R. Silva-González ◽  
J.M. Gracia-Jiménez ◽  
M.E. Hernández-Torres ◽  
M. Avendaño-Alejo ◽  
...  
Keyword(s):  
Substrate Temperature ◽  
Physical Characteristics ◽  
Aluminum Concentration ◽  
Thin Solid Films ◽  
Solid Films

Electrochoromic Display Using V2O5 Amorphous Thin Solid Films

1988 ◽  
Vol 17 (3) ◽  
pp. 76-78
Author(s):  
Ramakuru N. Prasad ◽  
Abayankar Neelima ◽  
R. N. Karekar
Keyword(s):  
Thin Solid Films ◽  
Solid Films

scholarly journals Corrigendum to Procedure to convert optical-constant models into analytic Thin Solid Films (2018) 52-59

2021 ◽  
Vol 733 ◽  
pp. 138816
Author(s):  
Juan I. Larruquert ◽  
Luis V. Rodríguez-de Marcos
Keyword(s):  
Optical Constant ◽  
Thin Solid Films ◽  
Solid Films

Electrical Characterization of Low Temperature GaAs Layers, and Observation of the Extremely Large Carrier Concentrations in Undoped Material

1991 ◽  
Vol 241 ◽  
Author(s):  
Bijan Tadayon ◽  
Mohammad Fatemi ◽  
Saied Tadayon ◽  
F. Moore ◽  
Harry Dietrich
Keyword(s):  
Molecular Beam Epitaxy ◽  
Low Temperature ◽  
Substrate Temperature ◽  
Molecular Beam ◽  
Electrical Characterization ◽  
Physical Characteristics ◽  
Hall Measurements ◽  
Undoped Material ◽  
Low Temperature Gaas

ABSTRACTWe present here the results of a study on the effect of substrate temperature, Ts, on the electrical and physical characteristics of low temperature (LT) molecular beam epitaxy GaAs layers. Hall measurements have been performed on the asgrown samples and on samples annealed at 610 °C and 850 °C. Si implantation into these layers has also been investigated.

Sensitivity Enhancement of Surface Plasmon Resonance Sensor with Two Dimensional Materials Covered on Silver-Nickel Bimetallic Thin Solid Films

2020 ◽  
Vol 18 (10) ◽  
pp. 776-779
Author(s):  
L. Castañeda
Keyword(s):  
2D Materials ◽  
Sensitivity Enhancement ◽  
Thin Solid Films ◽  
Solid Films ◽  
Kretschmann Configuration ◽  
Enhanced Sensitivity ◽  
Resonance Sensor ◽  
Two Dimensional Materials ◽  
Fresnel Equation ◽  
Hybrid Configuration

In this paper a new sensing configuration with enhanced sensitivity utilizing 2D materials on the bimetallic layers of Magnetic Material Ni over Ag for Kretschmann configuration is proposed and analyzed numerically using Fresnel equation and transfer matrix method. Results show that such a hybrid configuration with well optimized thickness of metallic layer and utilization of specific no. of 2D materials can increases the sensitivity as high as 298°/RIU is absorbed for the configuration consist 10 nm of Ni over 40 nm thickness of Ag added with a 2 layers of WSe2.

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