Heat Treatment at Different Temperatures and its Effect on the Optical Properties of Pure PMMA and PMMA-Coumarin

The effect of thermal treatment on optical constants of pure PMMA and with addition (15 and 35) ml of coumarin at different temperatures (100, 110 and 120) C0 for 1 hour were investigated. Cast method used to prepares films of pure PMMA and PMMA with (15 and 35) of coumarin. UV/VIS spectrometer technique used to measure the absorption spectra for these films. The optical constant (absorption spectra and absorption coefficient) don’t changes after applied temperatures in pure PMMA film but the optical constant (absorption spectra and absorption coefficient) in PMMA with (15 and 35) ml of coumarin increased with applied temperatures. The optical energy gap of pure PMMA and PMMA with (15 and 35) ml of coumarin slightly decreased after applied temperature up to 1200 C.

Design and Optimization of Surface Plasmon Resonance Spectroscopy for Optical Constant Characterization and Potential Sensing Application: Theoretical and Experimental Approaches

The best surface plasmon resonance (SPR) signal can be generated based on several factors that include the excitation wavelength, the type of metal used, and the thickness of the metal layer. In this study, the aforementioned factors have been investigated to obtain the best SPR signal. The excitation wavelength of 633 nm and gold metal with thickness of 50 nm were required to generate the SPR signal before the SPR was used for optical constant characterization by fitting of experimental results to the theoretical data. The employed strategy has good agreement with the theoretical value where the real part refractive index, n value, of the gold thin film was 0.1245 while the value for the imaginary part, k, was 3.6812 with 47.7 nm thickness. Besides that, the optical characterization of nanocrystalline cellulose (NCC)-based thin film has also been demonstrated. The n and k values found for this thin film were 1.4240 and 0.2520, respectively, with optimal thickness of 9.5 nm. Interestingly when the NCC-based thin film was exposed to copper ion solution with n value of 1.3333 and k value of 0.0060 to 0.0070 with various concentrations (0.01–10 ppm), a clear change of the refractive index value was observed. This result suggests that the NCC-based thin film has high potential for copper ion sensing using SPR with a sensitivity of 8.0052°/RIU.

Measuring Complex Refractive Indices of a Nanometer-Thick Superconducting Film Using Terahertz Time-Domain Spectroscopy with a 10 Femtoseconds Pulse Laser

Superconducting thin films are widely applied in various fields, including switching devices, because of their phase transition behaviors in relation to temperature changes. Therefore, it is important to quantitatively determine the optical constant of a superconducting material in the thin-film state. We performed a terahertz time-domain spectroscopy, based on a 10 femtoseconds pulse laser, to measure the optical constant of a superconducting GdBa2Cu3O7−x (GdBCO) thin film in the terahertz region. We then estimated the terahertz refractive indices of the 70 nm-thick GdBCO film using a numerical extraction process, even though the film thickness was approximately 1/10,000 times smaller than the terahertz wavelength range of 200 μm to 1 mm. The resulting refractive indices of the GdBCO thin film were consistent with the theoretical results using the two-fluid model. Our work will help to further understand the terahertz optical properties of superconducting thin films with thicknesses under 100 nm, as well as provide a standard platform for characterizing the optical properties of thin films without the need of Kramers–Kronig transformation at the terahertz frequencies.

Optical Constant and Conformality Analysis of SiO2 Thin Films Deposited on Linear Array Microstructure Substrate by PECVD

SiO2 thin films are deposited by radio frequency (RF) plasma-enhanced chemical vapor deposition (PECVD) technique using SiH4 and N2O as precursor gases. The stoichiometry of SiO2 thin films is determined by the X-ray photoelectron spectroscopy (XPS), and the optical constant n and k are obtained by using variable angle spectroscopic ellipsometer (VASE) in the spectral range 380–1600 nm. The refractive index and extinction coefficient of the deposited SiO2 thin films at 500 nm are 1.464 and 0.0069, respectively. The deposition rate of SiO2 thin films is controlled by changing the reaction pressure. The effects of deposition rate, film thickness, and microstructure size on the conformality of SiO2 thin films are studied. The conformality of SiO2 thin films increases from 0.68 to 0.91, with the increase of deposition rate of the SiO2 thin film from 20.84 to 41.92 nm/min. The conformality of SiO2 thin films decreases with the increase of film thickness, and the higher the step height, the smaller the conformality of SiO2 thin films.

Relationship between Photoelasticity of Polyurethane and Dielectric Anisotropy of Diisocyanate, and Application of High-Photoelasticity Polyurethane to Tactile Sensor for Robot Hands

Eight types of polyurethane were synthesized using seven types of diisocyanate. It was found that the elasto-optical constant depends on the concentration of diisocyanate groups in a unit volume of a polymer and the magnitude of anisotropy of the dielectric constant of diisocyanate groups. It was also found that incident light scattered when bending stress was generated inside photoelastic polyurethanes. A high sensitive tactile sensor for robot hands was devised using one of the developed polyurethanes with high photoelasticity.