The contribution of stable isotopic tracing, narrow nuclear resonance depth profiling, and a simple stochastic theory of charged particle energy loss to studies of the dry thermal oxidation of SiC
2005 ◽
Vol 232
(1-4)
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pp. 272-279
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2016 ◽
Vol 75
(3)
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pp. 201-213
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1972 ◽
Vol 49
(2)
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pp. 431-441
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1989 ◽
Vol 03
(02)
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pp. 183-187
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Keyword(s):
1977 ◽
Vol 143
(3)
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pp. 595-600
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Keyword(s):
Keyword(s):
1977 ◽
Vol 145
(3)
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pp. 555-563
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Keyword(s):
Keyword(s):