Measurement of thickness profile and refractive index variation of a silicon wafer using the optical comb of a femtosecond pulse laser

2013 ◽  
Vol 305 ◽  
pp. 170-174 ◽  
Author(s):  
Jungjae Park ◽  
Jonghan Jin ◽  
Jae Wan Kim ◽  
Jong-Ahn Kim
Keyword(s):  
Refractive Index ◽  
Silicon Wafer ◽  
Pulse Laser ◽  
Femtosecond Pulse ◽  
Refractive Index Variation ◽  
Femtosecond Pulse Laser ◽  
Thickness Profile ◽  
Index Variation ◽  
Measurement Of Thickness

Submicron micromachining on silicon wafer using femtosecond pulse laser

2001 ◽  
Vol 13 (1) ◽  
pp. 41-43 ◽  
Author(s):  
Bryan K. A. Ngoi ◽  
K. Venkatakrishnan ◽  
L. E. N. Lim ◽  
B. Tan
Keyword(s):  
Silicon Wafer ◽  
Pulse Laser ◽  
Femtosecond Pulse ◽  
Femtosecond Pulse Laser

Spontaneous Recombination, Gain and Refractive Index Variation for 1.6 µm Wavelength InGaAsP/InP Lasers

1981 ◽  
Vol 20 (8) ◽  
pp. 1499-1505 ◽  
Author(s):  
Kristian Stubkjaer ◽  
Masahiro Asada ◽  
Shigehisa Arai ◽  
Yasuharu Suematsu
Keyword(s):  
Refractive Index ◽  
Refractive Index Variation ◽  
Spontaneous Recombination ◽  
Index Variation

Stress-induced refractive index variation in dry SiO2

1992 ◽  
Vol 65 (5) ◽  
pp. 961-966 ◽  
Author(s):  
A. Szekeres ◽  
K. Christova ◽  
A. Paneva
Keyword(s):  
Refractive Index ◽  
Refractive Index Variation ◽  
Index Variation
Sign in / Sign up

Export Citation Format

Share Document