Simultaneous measurement of thickness and refractive index using phase shifted Coherent Gradient Sensor

Optics & Laser Technology ◽

10.1016/j.optlastec.2016.06.015 ◽

2016 ◽

Vol 86 ◽

pp. 85-92 ◽

Author(s):

Reena Disawal ◽

Takamasa Suzuki ◽

Shashi Prakash

Keyword(s):

Refractive Index ◽

Simultaneous Measurement ◽

Measurement Of Thickness

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Line-Field Swept-Source Interferometer for Simultaneous Measurement of Thickness and Refractive Index Distribution

Journal of Lightwave Technology ◽

10.1109/jlt.2016.2605300 ◽

2017 ◽

Vol 35 (16) ◽

pp. 3584-3590 ◽

Author(s):

Soon-Woo Cho ◽

Gyeong Hun Kim ◽

Moonju Kim ◽

Bo Sung Shin ◽

Chang-Seok Kim

Keyword(s):

Refractive Index ◽

Simultaneous Measurement ◽

Refractive Index Distribution ◽

Swept Source ◽

Index Distribution ◽

Measurement Of Thickness

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Simultaneous Measurement of Thickness and Refractive Index of Transparent Material Using a Collimated Beam Having a Finite Radius

Korean Journal of Optics and Photonics ◽

10.3807/hkh.2009.20.1.029 ◽

2009 ◽

Vol 20 (1) ◽

pp. 29-33 ◽

Author(s):

Dae-Seo Park ◽

Beom-Hoan O ◽

Se-Geun Park ◽

El-Hang Lee ◽

Seung-Gol Lee

Keyword(s):

Refractive Index ◽

Simultaneous Measurement ◽

Transparent Material ◽

Finite Radius ◽

Measurement Of Thickness ◽

Collimated Beam

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Simultaneous measurement of thickness and refractive index using wedge plate lateral shearing interferometry and fourier transform method

2017 6th International Conference on Computer Applications In Electrical Engineering-Recent Advances (CERA) ◽

10.1109/cera.2017.8343359 ◽

2017 ◽

Author(s):

Amit Chatterjee ◽

Jitendra Dhanotia ◽

Vimal Bhatia ◽

Reena Disawal ◽

Shashi Prakash

Keyword(s):

Refractive Index ◽

Fourier Transform ◽

Simultaneous Measurement ◽

Transform Method ◽

Fourier Transform Method ◽

Shearing Interferometry ◽

Lateral Shearing ◽

Wedge Plate ◽

Measurement Of Thickness ◽

Lateral Shearing Interferometry

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Simultaneous measurement of thickness and refractive index by a single-channel self-mixing interferometer

IET Optoelectronics ◽

10.1049/iet-opt.2011.0044 ◽

2012 ◽

Vol 6 (1) ◽

pp. 7 ◽

Author(s):

M.T. Fathi ◽

S. Donati

Keyword(s):

Refractive Index ◽

Simultaneous Measurement ◽

Single Channel ◽

Measurement Of Thickness

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Simultaneous Measurement of Thickness and Refractive Index using Spectrum Multiplexing Digital Holographic Microscopy

Imaging and Applied Optics 2016 ◽

10.1364/dh.2016.dth3f.6 ◽

2016 ◽

Author(s):

Jiwei Zhang ◽

Chaojie Ma ◽

Ying Li ◽

Jianglei Di ◽

Teli Xi ◽

...

Keyword(s):

Refractive Index ◽

Simultaneous Measurement ◽

Digital Holographic Microscopy ◽

Holographic Microscopy ◽

Measurement Of Thickness

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Accurate and simultaneous measurement of thickness and refractive index of thermally evaporated thin organic films by surface plasmon resonance spectroscopy

Optics Express ◽

10.1364/oe.22.018914 ◽

2014 ◽

Vol 22 (16) ◽

pp. 18914 ◽

Author(s):

T. Del Rosso ◽

J. Edicson Hernández Sánchez ◽

R. Dos Santos Carvalho ◽

O. Pandoli ◽

M. Cremona

Keyword(s):

Refractive Index ◽

Surface Plasmon Resonance ◽

Surface Plasmon ◽

Plasmon Resonance ◽

Simultaneous Measurement ◽

Organic Films ◽

Resonance Spectroscopy ◽

Surface Plasmon Resonance Spectroscopy ◽

Thin Organic Films ◽

Measurement Of Thickness

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A novel method for simultaneous measurement of thickness, refractive index, bow, and warp of a large silicon wafer using a spectral-domain interferometer

10.1088/1681-7575/aba16b ◽

2020 ◽

Vol 57 (6) ◽

pp. 064001

Author(s):

Jungjae Park ◽

Jaeseok Bae ◽

Yoon-Soo Jang ◽

Jonghan Jin

Keyword(s):

Refractive Index ◽

Silicon Wafer ◽

Simultaneous Measurement ◽

Spectral Domain ◽

Novel Method ◽

Measurement Of Thickness

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B8.3 - Simultaneous Measurement of Thickness and Refractive Index by Chromatic Confocal Coherence Tomography (CCCT)

10.5162/sensor2017/b8.3 ◽

2017 ◽

Author(s):

T. Boettcher ◽

M. Gronle ◽

W. Osten

Keyword(s):

Refractive Index ◽

Simultaneous Measurement ◽

Measurement Of Thickness

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Simultaneous Measurement of Thickness and Refractive Index of Film by Using Spectral Analysis

Transactions of the Society of Instrument and Control Engineers ◽

10.9746/sicetr1965.22.976 ◽

1986 ◽

Vol 22 (9) ◽

pp. 976-981

Author(s):

Sadao FUJIMURA ◽

Atsuki MATSUMURA

Keyword(s):

Refractive Index ◽

Spectral Analysis ◽

Simultaneous Measurement ◽

Measurement Of Thickness

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Simultaneous measurement of thickness and refractive index based on rotation incidence angle

Journal of Modern Optics ◽

10.1080/09500340.2013.821536 ◽

2013 ◽

Vol 60 (11) ◽

pp. 900-905 ◽

Author(s):

Jiansen Ye ◽

Huiping Jiao ◽

Yu Su ◽

Zhihong Yang

Keyword(s):

Refractive Index ◽

Simultaneous Measurement ◽

Incidence Angle ◽

Measurement Of Thickness

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