A comparative study of mixed halide perovskite thin film preparation by three- and two-step electrodeposition techniques

2022 ◽  
Vol 123 ◽  
pp. 111909
Author(s):  
Zahra Heydari ◽  
Mahdi Madani ◽  
Niloofar Majidian-Taleghani ◽  
Razieh Teimouri ◽  
Hamed abdy ◽  
...  
2021 ◽  
pp. 413174
Author(s):  
Yuxin Shi ◽  
Pengwei Zhai ◽  
Lixiang Meng ◽  
Zongyin Huang ◽  
Guoqiang Li

2012 ◽  
Vol 1449 ◽  
Author(s):  
Jordi Farjas ◽  
Daniel Sanchez-Rodriguez ◽  
Hichem Eloussifi ◽  
Raul Cruz Hidalgo ◽  
Pere Roura ◽  
...  

ABSTRACTThermal analysis techniques are routinely applied to characterize the thermal behavior of metal organic precursors used for oxide film preparation. Since the mass of films is very low, researchers do their thermal analyses on powders and consider that the results are representative of films. We will show here that, in general, this assumption is not true. Several examples involving precursors of YBa2Cu3O7-x (Ba and Y trifluoroacetates and Ba propionate) will serve to appreciate that films can behave very differently than powders due to their enhanced heat and mass transport paths. Ultimately, we will demonstrate that, in some cases, relying on powders thermal analysis may lead to erroneous conclusions.


Vacuum ◽  
1991 ◽  
Vol 42 (1-2) ◽  
pp. 39-41 ◽  
Author(s):  
K Steenbeck ◽  
E Steinbeiß ◽  
S Winkler ◽  
G Schmidt ◽  
G Bruchlos

Shinku ◽  
1991 ◽  
Vol 34 (3) ◽  
pp. 226-228
Author(s):  
Shuji KOMURO ◽  
Patrick O'KEEFFE ◽  
Shoji DEN ◽  
Takitaro MORIKAWA ◽  
Yoshinobu AOYAGI

2020 ◽  
Vol 20 (6) ◽  
pp. 3909-3912 ◽  
Author(s):  
Muhunthan Nadarajah ◽  
Kuldeep Singh Gour ◽  
Vidya Nand Singh

In this study, we present a process to deposit cadmium sulfide (CdS) thin film on glass substrate using in-house made CdS sputter target deposited by RF (radio frequency) magnetron sputtering. The bandgap of CdS film was about 2.4 eV estimated using tauc plot. Structural analysis was done using XRD and highest peak is at (101) and two other small peaks at (100) and (110) confirm CdS phase. Raman analysis was done for further confirmation of phases present in CdS film where peaks at 299.97 cm−1 and 599.8 cm−1 showed phase pure CdS film. The sputtering method used for CdS thin film preparation is an industrially viable technique and can be used for in line mass production.


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