Analysis of frequency-dependent series resistance and interface states of In/SiO2/p-Si (MIS) structures
2007 ◽
Vol 400
(1-2)
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pp. 149-154
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2013 ◽
Vol 185-186
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pp. 167-171
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2008 ◽
Vol 85
(1)
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pp. 81-88
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2011 ◽
Vol 406
(4)
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pp. 771-776
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2007 ◽
Vol 84
(1)
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pp. 180-186
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2008 ◽
Vol 23
(10)
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pp. 105014
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2010 ◽
Vol 79
(4)
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pp. 457-461
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2008 ◽
Vol 85
(11)
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pp. 2316-2321
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2013 ◽
Vol 13
(7)
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pp. 1225-1230
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