scholarly journals Reliability growth analysis of k-out-of-N systems using matrix-based system reliability method

2017 ◽  
Vol 165 ◽  
pp. 410-421 ◽  
Author(s):  
Ji-Eun Byun ◽  
Hee-Min Noh ◽  
Junho Song
Keyword(s):  
System Reliability ◽  
Growth Analysis ◽  
Reliability Growth ◽  
Reliability Method

SYSTEM RELIABILITY GROWTH ANALYSIS USING COMPONENT FAILURE DATA

1994 ◽  
Vol 01 (01) ◽  
pp. 71-83 ◽  
Author(s):  
M. XIE ◽  
T.N. GOH
Keyword(s):  
System Reliability ◽  
Growth Analysis ◽  
Simple Approach ◽  
System Level ◽  
Reliability Growth ◽  
System Failure ◽  
Component Level ◽  
Component Failure ◽  
Failure Data ◽  
Growth Estimation

In this paper the problem of system-level reliability growth estimation using component-level failure data is studied. It is suggested that system failure data should be broken down into component, or subsystem, failure data when the above problems have occurred during the system testing phase. The proposed approach is especially useful when the system is not unchanged over the time, when some subsystems are improved more than others, or when the testing has been concentrated on different components at different time. These situations usually happen in practice and it may also be the case even if the system failure data is provided. Two sets of data are used to illustrate the simple approach; one is a set of component failure data for which all subsystems are available for testing at the same time and for the other set of data, the starting times are different for different subsystems.

scholarly journals System Reliability Growth Analysis during Warranty

2019 ◽  
Vol 4 (1) ◽  
pp. 85-94 ◽  
Author(s):  
James Li ◽  
Greg Collins ◽  
Ravi Govindarajulu
Keyword(s):  
System Reliability ◽  
Growth Analysis ◽  
Growth Models ◽  
Primary Objective ◽  
Reliability Growth ◽  
Failure Data ◽  
Duane Model ◽  
Actual Field ◽  
Reliability Performance ◽  
Field Failure

This paper presents system reliability growth analysis using actual field failure data. The primary objective of the system reliability growth is to improve the achievement of system reliability performance during system reliability demonstration, in order to achieve the predicted or contractually required system reliability commitment. An effective reliability growth model can be utilized to predict when the reliability target can be achieved based on previous reliability performance. In this paper, the system reliability growth analysis is illustrated using the Duane and AMSAA reliability growth models to determine applicability and aid in choice determination. The Duane model is a better choice for failure terminated reliability growth while AMSAA is a better choice for time terminated reliability growth. Comparisons of the Duane versus AMSAA model are carried out by conducting the statistical analysis on the observed field failures.

Fault Diagnosis and Reliability Growth for Information System

2014 ◽  
Vol 590 ◽  
pp. 763-767
Author(s):  
Zhi Hui Huang
Keyword(s):  
Information System ◽  
Bayesian Network ◽  
System Reliability ◽  
Functional Module ◽  
Decision Problems ◽  
Reliability Growth ◽  
Failure Data ◽  
Manufacturing Execution Systems ◽  
Growth Planning ◽  
Manufacturing Execution

This paper aiming at the zero-failure data and uncertain-decision problems exist in the information system reliability growth process, it proposes to build the Bayesian network topology of FMEA. It adopts Leaky Noisy-OR model, and it analyses the probability that the subsystem functional module will go wrong in quantity. It solves the problem of identifying the vague and incomplete information exists in the complex system rapidly and accurately, laying the foundation for further study of the reliability growth comprehensive ability assessment of system based on the Bayesian network. In this paper, on the background of Manufacturing Execution Systems (MES) engineering, aimed at research on models and evaluation methods of reliability growth for MES, enclosing reliability of MES task and design target, reliability growth test and analysis methods, it proposes the goal of MES reliability growth planning.

A Partial Safety Factor Method for System Reliability Prediction With Outsourced Components

2019 ◽  
Vol 5 (2) ◽  
Author(s):  
Zhengwei Hu ◽  
Xiaoping Du
Keyword(s):  
System Reliability ◽  
Joint Probability ◽  
System Level ◽  
Safety Factors ◽  
Component Reliability ◽  
Reliability Method ◽  
Component Supplier ◽  
Partial Safety Factors ◽  
Joint Probability Density ◽  
Probability Density Function Pdf

System reliability is usually predicted with the assumption that all component states are independent. This assumption may not accurate for systems with outsourced components since their states are strongly dependent and component details may be unknown. The purpose of this study is to develop an accurate system reliability method that can produce complete joint probability density function (PDF) of all the component states, thereby leading to accurate system reliability predictions. The proposed method works for systems whose failures are caused by excessive loading. In addition to the component reliability, system designers also ask for partial safety factors for shared loadings from component suppliers. The information is then sufficient for building a system-level joint PDF. Algorithms are designed for a component supplier to generate partial safety factors. The method enables accurate system reliability predictions without requiring proprietary information from component suppliers.

scholarly journals Accelerated Reliability Growth Test for Magnetic Resonance Imaging System Using Time-of-Flight Three-Dimensional Pulse Sequence

Diagnostics ◽  
2019 ◽  
Vol 9 (4) ◽  
pp. 164
Author(s):  
Anand ◽  
Shin ◽  
Saxena ◽  
Memon
Keyword(s):  
System Reliability ◽  
Pulse Sequence ◽  
Three Dimensional ◽  
Life Time ◽  
Test Duration ◽  
Reliability Growth ◽  
Resonance Imaging ◽  
Test Cycle ◽  
Time Stress ◽  
Growth Test

A magnetic resonance imaging (MRI) system is a complex, high cost, and long-life product. It is a widely known fact that performing a system reliability test of a MRI system during the development phase is a challenging task. The major challenges include sample size, high test cost, and long test duration. This paper introduces a novel approach to perform a MRI system reliability test in a reasonably acceptable time with one sample size. Our approach is based on an accelerated reliability growth test, which consists of test cycle made of a very high-energy time-of-flight three-dimensional (TOF3D) pulse sequence representing an actual hospital usage scenario. First, we construct a nominal day usage scenario based on actual data collected from an MRI system used inside the hospital. Then, we calculate the life-time stress based on a usage scenario. Finally, we develop an accelerated reliability growth test cycle based on a TOF3D pulse sequence that exerts highest vibration energy on the gradient coil and MRI system. We use a vibration energy model to map the life-time stress and reduce the test duration from 537 to 55 days. We use a Crow AMSAA plot to demonstrate that system design reaches its useful life after crossing the infant mortality phase.

scholarly journals On Software and System Reliability Growth and Testing

2016 ◽  
Vol 31 (4) ◽  
pp. 541-544
Author(s):  
Frank P. A. Coolen
Keyword(s):  
System Reliability ◽  
Reliability Growth
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