scholarly journals Study of dielectric relaxation and thermally activated a.c. conduction in multicomponent Ge10−xSe60Te30Inx (0 ≤ x ≤ 6) chalcogenide glasses using CBH model

2019 ◽  
Vol 12 ◽  
pp. 223-236 ◽  
Author(s):  
Pravin Kumar Singh ◽  
S.K. Sharma ◽  
S.K. Tripathi ◽  
D.K. Dwivedi
RSC Advances ◽  
2017 ◽  
Vol 7 (31) ◽  
pp. 19085-19097 ◽  
Author(s):  
Arvind Sharma ◽  
N. Mehta

Illustration of CBH model of the Coulombic well.


1979 ◽  
Vol 33 (2) ◽  
pp. 205-224 ◽  
Author(s):  
K.K. Srivastava ◽  
A. Kumar ◽  
O.S. Panwar ◽  
K.N. Lakshminarayan

Author(s):  
Deepika Deepika ◽  
Hukum Singh

The present paper reports the ac conductivity and dielectric relaxation of Se80−xTe20Bix (x=6, 12) glasses at various temperatures and frequencies. It was found that ac conductivity increases on increase of frequency, temperature as well as Bi content. The increase in conductivity is due to the formation of lower energy Se–Bi and Te–Bi bonds which takes the system to a stable lower energy configuration. The values of frequency exponent (s) were calculated and it was found that samples obey CBH model of conduction. Density of states (N(Ef)) near the fermi level were calculated at different temperatures and it was found that addition of Bi increases the number of localised states in the tails which leads to increase in ac conductivity. Further, it was found that dielectric parameters increase with increase in temperature. However, a decrease in both dielectric constant (ε′) and dielectric loss ((ε″) was observed with increase in frequency. Beside this, dielectric relaxation time (τ) and activation energy of relaxation (∆Eτ) were also determined for both the samples under study and was found to be lower for Se68Te20Bi12 glass.


Materials ◽  
2019 ◽  
Vol 12 (24) ◽  
pp. 4026 ◽  
Author(s):  
Songwei Wang ◽  
Xin Zhang ◽  
Rong Yao ◽  
Liguo Fan ◽  
Huaiying Zhou

High temperature dielectric relaxation behaviors of single phase Mn3O4 polycrystalline ceramics prepared by spark plasma sintering technology have been studied. Two dielectric relaxations were observed in the temperature range of 200 K–330 K and in the frequency range of 20 Hz–10 MHz. The lower temperature relaxation is a type of thermally activated relaxation process, which mainly results from the hopping of oxygen vacancies based on the activation energy analysis. There is another abnormal dielectric phenomenon that is different from the conventional thermally activated behavior and is related to a positive temperature coefficient of resistance (PTCR) effect in the temperature region. In line with the impedance analyses, we distinguished the contributions of grains and grain boundaries. A comparison of the frequency-dependent spectra of the imaginary impedance with imaginary electric modulus suggests that both the long range conduction and the localized conduction are responsible for the dielectric relaxations in the Mn3O4 polycrystalline samples.


2011 ◽  
Vol 46 (13) ◽  
pp. 4509-4516 ◽  
Author(s):  
A. Sharma ◽  
N. Mehta ◽  
A. Kumar

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