Strength of nanoscale metallic multilayers

2018 ◽  
Vol 145 ◽  
pp. 132-136 ◽  
Author(s):  
Samikshya Subedi ◽  
Irene J. Beyerlein ◽  
Richard LeSar ◽  
Anthony D. Rollett
2020 ◽  
Vol 31 (29) ◽  
pp. 292002 ◽  
Author(s):  
A Sáenz-Trevizo ◽  
A M Hodge

2012 ◽  
Vol 18 (5) ◽  
pp. 1155-1162 ◽  
Author(s):  
Nan Li ◽  
Jian Wang ◽  
Amit Misra ◽  
Jian Yu Huang

AbstractIn situ nanoindentation of a 30 nm Cu/20 nm Nb multilayer film in a transmission electron microscope revealed confined layer slip as the dominant deformation mechanism. Dislocations were observed to nucleate from the Cu-Nb interfaces in both layers. Dislocation glide was confined by interfaces to occur within each layer, without transmission across interfaces. Cu and Nb layers co-deformed to large plastic strains without cracking. These microscopy observations provide insights in the unit mechanisms of deformation, work hardening, and recovery in nanoscale metallic multilayers.


2008 ◽  
Vol 77 (16) ◽  
Author(s):  
B. Roldan Cuenya ◽  
W. Keune ◽  
R. Peters ◽  
E. Schuster ◽  
B. Sahoo ◽  
...  

2009 ◽  
Vol 24 (3) ◽  
pp. 1291-1302 ◽  
Author(s):  
D. Bhattacharyya ◽  
N.A. Mara ◽  
P. Dickerson ◽  
R.G. Hoagland ◽  
A. Misra

Nanoscale metallic multilayers, comprising two sets of materials—Cu/Nb and Cu/Ni—were deposited in two different layer thicknesses—nominally 20 and 5 nm. These multilayer samples were indented, and the microstructural changes under the indent tips were studied by extracting samples from underneath the indents using the focused ion beam (FIB) technique and by examining them under a transmission electron microscope (TEM). The deformation behavior underneath the indents, manifested in the bending of layers, reduction in layer thickness, shear band formation, dislocation crossing of interfaces, and orientation change of grains, has been characterized and interpreted in terms of the known deformation mechanisms of nanoscale multilayers.


2008 ◽  
Vol 14 (S2) ◽  
pp. 412-413
Author(s):  
D Bhattacharyya ◽  
N Mara ◽  
P Dickerson ◽  
R Hoagland ◽  
A Misra

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008


2014 ◽  
Vol 571 ◽  
pp. 268-274 ◽  
Author(s):  
A.S. Ramos ◽  
A.J. Cavaleiro ◽  
M.T. Vieira ◽  
J. Morgiel ◽  
G. Safran

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