tem characterization
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An in-situ TEM characterization of electron beam induced dislocation motion in a single-crystalline gold thin film

2021 ◽  
pp. 111697
Author(s):  
Chi Xu ◽  
Wentuo Han ◽  
Wenbin Xue ◽  
Yongliang Li ◽  
Song Li ◽  
...  
Keyword(s):  
Thin Film ◽  
Electron Beam ◽  
Dislocation Motion ◽  
In Situ Tem ◽  
Single Crystalline ◽  
Gold Thin Film ◽  
Tem Characterization ◽  
Induced Dislocation

Creep properties of advanced austenitic steel 709 determined through short experiments under in-situ neutron diffraction followed by TEM characterization

2021 ◽  
pp. 111519
Author(s):  
Yuchen Zhao ◽  
Ryan Schoell ◽  
Ce Zheng ◽  
Mahmut N. Cinbiz ◽  
Matthew Frost ◽  
...  
Keyword(s):  
Neutron Diffraction ◽  
Austenitic Steel ◽  
Creep Properties ◽  
Tem Characterization ◽  
In Situ Neutron Diffraction

scholarly journals Cryo-TEM Characterization of the Early Stages of the Uranium Oxalate Growth Evolution

2021 ◽  
Vol 27 (S1) ◽  
pp. 1940-1941
Author(s):  
Karen Kruska ◽  
Shalini Tripathi ◽  
Gabriel Hall ◽  
Edgar Buck
Keyword(s):  
Early Stages ◽  
Tem Characterization ◽  
Growth Evolution

scholarly journals S/TEM Characterization of Vertical Heterostructures Formed by Mono- to Multi-layer Graphene and WSe2

2021 ◽  
Vol 27 (S1) ◽  
pp. 894-895
Author(s):  
Saiphaneendra Bachu ◽  
Benjamin Huet ◽  
Danielle Reifsnyder Hickey ◽  
Chenhao Qian ◽  
Joan Redwing ◽  
...  
Keyword(s):  
Layer Graphene ◽  
Tem Characterization

scholarly journals TEM Characterization of retained austenite on modified TRIP800 steel

2021 ◽  
Vol 27 (S1) ◽  
pp. 3266-3268
Author(s):  
Nikolaos Makris ◽  
Angelos Kaldellis ◽  
Petros Tsakiridis ◽  
George Fourlaris
Keyword(s):  
Retained Austenite ◽  
Tem Characterization

TEM Characterization of Long Term Aged Interconnect Oxide Layers from Real Stack

2021 ◽  
Vol MA2021-03 (1) ◽  
pp. 48-48
Author(s):  
Stéphane Poitel ◽  
Samaneh Daviran ◽  
Manuel Bianco ◽  
Christian Walter ◽  
Kai Herbrig ◽  
...  
Keyword(s):  
Oxide Layers ◽  
Tem Characterization

TEM Characterization of Long Term Aged Interconnect Oxide Layers from Real Stack

2021 ◽  
Vol 103 (1) ◽  
pp. 1283-1300
Author(s):  
Stéphane Poitel ◽  
Samaneh Daviran ◽  
Manuel Bianco ◽  
Christian Walter ◽  
Kai Herbrig ◽  
...  
Keyword(s):  
Oxide Layers ◽  
Tem Characterization

Raman and TEM characterization of 2D layered MoS2 crystals grown on non-metal surfaces by friction-induced synthesis

2021 ◽  
pp. 150016
Author(s):  
Tadao Tanabe ◽  
Junya Osaki ◽  
Makoto Miyajima ◽  
Kazuyuki Kitamura ◽  
Yutaka Oyama
Keyword(s):  
Metal Surfaces ◽  
Tem Characterization ◽  
Layered Mos2
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