Fundamental constraints imposed by energy barriers on the fill factor and on the efficiency of silicon heterojunction solar cells

2017 ◽  
Vol 171 ◽  
pp. 228-238 ◽  
Author(s):  
Moustafa Ghannam ◽  
Yaser Abdulraheem
2020 ◽  
Vol 28 (4) ◽  
pp. 307-320 ◽  
Author(s):  
Luca Martini ◽  
Luca Serenelli ◽  
Francesca Menchini ◽  
Massimo Izzi ◽  
Mario Tucci

2013 ◽  
Vol 38 ◽  
pp. 297-304 ◽  
Author(s):  
Markus Reusch ◽  
Martin Bivour ◽  
Martin Hermle ◽  
Stefan W. Glunz

2011 ◽  
Vol 1 (2) ◽  
pp. 130-134 ◽  
Author(s):  
Jan Haschke ◽  
Nicola Mingirulli ◽  
Ralf Gogolin ◽  
Rafel Ferré ◽  
Tim F. Schulze ◽  
...  

2020 ◽  
Author(s):  
Shenghao Li ◽  
Manuel Pomaska ◽  
Andreas Lambertz ◽  
Weiyuan Duan ◽  
Karsten Bittkau ◽  
...  

Abstract In order to compensate the insufficient conductance of heterojunction thin films, transparent conductive oxides (TCO) have been used for decades in both-sides contacted crystalline silicon heterojunction (SHJ) solar cells to provide lateral conduction for efficient carrier collection. In this work, we substitute the TCO layers by utilizing the lateral conduction of c-Si absorber, thereby enabling a TCO-free design. A series resistance of 0.32 Ωcm2 and a fill factor of 80.7% were measured for a TCO-free back-junction SHJ solar cell with a conventional finger pitch of 1.8 mm, thereby proving that relying on lateral conduction in the c-Si bulk is compatible with low series resistances. Achieving high efficiencies in SHJ solar cells with TCO-free front contacts requires suppressing deterioration of the passivation quality induced by direct metal-a-Si:H contacts and in-diffusion of metal into the a-Si:H layer. We show that an ozone treatment at the a-Si:H/metal interface suppresses the metal diffusion and improves the passivation without increasing the contact resistivity. SHJ solar cells with TCO-free front contacts and ozone treatment achieve efficiencies of > 22%.


2018 ◽  
Vol 8 (10) ◽  
pp. 1846
Author(s):  
Moustafa Ghannam ◽  
Yaser Abdulraheem

An electro-physical interpretation for the degradation of the Fill Factor in p+/n silicon heterojunction solar cells (SHJ) due to incomplete hole collection at the thermionic emission barrier at the amorphous/crystalline silicon (a-Si:H/c-Si) hetero-interface is proposed supported by results of AFORS-HET device simulations. Under illumination, reflected holes at the thermionic barrier pile up at the hetero-interface which strengthens the dipole with the negative dopant ions in the doped a-Si:H(p+) layer and enhances the electric field passing through the a-Si:H layer. Such an enhanced electric field sweeps back the free holes spilling over in the intrinsic a-Si:H(i) layer from the a-Si:H(p+) layer considerably depleting the double a-Si:H layer and enhancing its resistance and the overall cell series resistance. Therefore, the degradation due to incomplete hole collection at the thermionic emission barrier under illumination can be assimilated to the effect of a series resistance does not affect the cell open circuit voltage but degrades only its fill factor. The resistance enhancement is found to be bias-dependent and to increase with decreasing the doping level in a-Si:H(p+). Predictions of the proposed model for different hole reflection probability at the barrier and for different thicknesses of the intrinsic a-Si:H(i) layer agree perfectly with the results of simulations.


2019 ◽  
Author(s):  
Jafar Khan ◽  
Yuliar Firdaus ◽  
Federico Cruciani ◽  
Shengjian Liu ◽  
Denis Andrienko ◽  
...  

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