Element-selective spin polarization analysis of surfaces by spin-polarized ion scattering spectroscopy

2010 ◽  
Vol 604 (19-20) ◽  
pp. 1767-1771 ◽  
Author(s):  
T.T. Suzuki ◽  
H. Kuwahara ◽  
Y. Yamauchi
1993 ◽  
Vol 313 ◽  
Author(s):  
N. J. Zheng ◽  
C. Rau

ABSTRACTWe have developed a novel, high-resolution magnetic imaging technique, scanning-ion microscopy with polarization analysis (SIMPA). In SIMPA, a highly-focused, scanning Ga+ ion beam is used to excite spin-polarized electrons at surfaces of ferromagnetic Materials. By Measuring the intensity and the spin polarization of the emitted electrons using a newly developed, compact mott polarimeter, topographic and magnetic images of magnetic structures are obtained. We report on first SIMPA studies on single-crystalline Fe samples.


2008 ◽  
Vol 24 (1) ◽  
pp. 81-85 ◽  
Author(s):  
Taku SUZUKI ◽  
Yasushi YAMAUCHI

2008 ◽  
Vol 602 (9) ◽  
pp. 1688-1692 ◽  
Author(s):  
T.T. Suzuki ◽  
S. Entani ◽  
Y. Yamauchi

2000 ◽  
Vol 183-185 ◽  
pp. 207-214 ◽  
Author(s):  
Takayuki Kobayashi ◽  
C.F. McConville ◽  
J. Nakamura ◽  
G. Dorenbos ◽  
H. Sone ◽  
...  

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