Ion mobility spectrometer with orthogonal X-Ray source for increased sensitivity
2018 ◽
Vol 185
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pp. 537-541
◽
Erik Bunert
◽
Tobias Reinecke
◽
Ansgar T. Kirk
◽
Alexander Bohnhorst
◽
Stefan Zimmermann
V.S. Pershenkov
◽
A.U. Razvalyaev
◽
A.D. Tremasov
2016 ◽
Vol 87
(5)
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pp. 053120
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T. Reinecke
◽
A. T. Kirk
◽
A. Heptner
◽
D. Niebuhr
◽
S. Böttger
◽
...
2006 ◽
Vol 46
(2-4)
◽
pp. 641-644
◽
V.S. Pershenkov
◽
A.D. Tremasov
◽
V.V. Belyakov
◽
A.U. Razvalyaev
◽
V.S. Mochkin
C. Thoben
◽
C.-R. Raddatz
◽
M. Lippmann
◽
Z. Salehi Moghaddam
◽
S. Zimmermann
Reno F. DeBono
◽
Pauline E. Leary
2016 ◽
Vol 19
(4)
◽
pp. 175-182
◽
Andre Heptner
◽
Nico Angerstein
◽
Tobias Reinecke
◽
Erik Bunert
◽
Ansgar T. Kirk
◽
...
2016 ◽
Vol 37
(4)
◽
pp. 604-607
◽
Sung-Seen Choi
◽
Chae Eun Son
◽
Myung-Won Shin
◽
Gyu Seop Choi
2009 ◽
Vol 13
(1)
◽
pp. 1-7
◽
Daniella Morgos
◽
Ivan Geroy
◽
Richard G. Sevier
◽
Molly M. Gribb
◽
Kevin P. Ryan
◽
...
1987 ◽
Vol 20
(11)
◽
pp. 1422-1424
◽
A Prini
◽
A H Lawrence
◽
S Laframboise
Maria Salvato
◽
Ettore Massera
◽
Saverio De Vito
◽
Sara Kirchner
◽
Cecilia Gestraud
◽
...