On domain-partitioning induction criteria: worst-case bounds for the worst-case based

As was shown recently, many important AI problems require counting the number of models of propositional formulas. The problem of counting models of such formulas is, according to present knowledge, computationally intractable in a worst case. Based on the Davis-Putnam procedure, we present an algorithm, CDP, that computes the exact number of models of a propositional CNF or DNF formula F. Let m and n be the number of clauses and variables of F, respectively, and let p denote the probability that a literal l of F occurs in a clause C of F, then the average running time of CDP is shown to be O(nm^d), where d=-1/log(1-p). The practical performance of CDP has been estimated in a series of experiments on a wide variety of CNF formulas.

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Worst-case based robust distributed beamforming for relay networks

2013 IEEE International Conference on Acoustics, Speech and Signal Processing ◽

10.1109/icassp.2013.6638605 ◽

2013 ◽

Cited By ~ 4

Author(s):

Haihua Chen ◽

Li Zhang

Keyword(s):

Relay Networks ◽

Distributed Beamforming ◽

Worst Case ◽

Case Based

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Worst-case-based methodology for tolerance analysis and tolerance allocation of optical systems

Applied Optics ◽

10.1364/ao.49.006179 ◽

2010 ◽

Vol 49 (31) ◽

pp. 6179 ◽

Cited By ~ 3

Author(s):

Chun-Che Hsueh ◽

Psang Dain Lin ◽

Jose Sasian

Keyword(s):

Tolerance Analysis ◽

Tolerance Allocation ◽

Optical Systems ◽

Worst Case ◽

Case Based

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Mosaic Mapping: A Means of Tiling Images to Shorten Acquisition Speed for Lower - Magnification SEM Images and Wavelength Dispersive Spectrometers (WDS) X-Ray Maps

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100164659 ◽

1996 ◽

Vol 54 ◽

pp. 438-439

Author(s):

J.D. Geller ◽

C.R. Herrington

Keyword(s):

Limiting Factors ◽

X Rays ◽

Angular Range ◽

Acceptance Angle ◽

Sem Images ◽

Worst Case ◽

X Ray ◽

Focusing Distance ◽

Layered Crystals ◽

Working Distance

The minimum magnification for which an image can be acquired is determined by the design and implementation of the electron optical column and the scanning and display electronics. It is also a function of the working distance and, possibly, the accelerating voltage. For secondary and backscattered electron images there are usually no other limiting factors. However, for x-ray maps there are further considerations. The energy-dispersive x-ray spectrometers (EDS) have a much larger solid angle of detection that for WDS. They also do not suffer from Bragg’s Law focusing effects which limit the angular range and focusing distance from the diffracting crystal. In practical terms EDS maps can be acquired at the lowest magnification of the SEM, assuming the collimator does not cutoff the x-ray signal. For WDS the focusing properties of the crystal limits the angular range of acceptance of the incident x-radiation. The range is dependent upon the 2d spacing of the crystal, with the acceptance angle increasing with 2d spacing. The natural line width of the x-ray also plays a role. For the metal layered crystals used to diffract soft x-rays, such as Be - O, the minimum magnification is approximately 100X. In the worst case, for the LEF crystal which diffracts Ti - Zn, ˜1000X is the minimum.

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