Defect centers and room temperature persistent spectral hole burning in X-ray irradiated Eu3+-doped glass

2002 ◽  
Vol 96 (2-4) ◽  
pp. 163-169 ◽  
Author(s):  
Masayuki Nogami ◽  
Tomotaka Ishikawa ◽  
Tomokatsu Hayakawa
2000 ◽  
Vol 12 (23) ◽  
pp. 5061-5067 ◽  
Author(s):  
Jianrong Qiu ◽  
Kentarou Nouchi ◽  
Kiyotaka Miura ◽  
Tsuneo Mitsuyu ◽  
Kazuyuki Hirao

2000 ◽  
Vol 61 (21) ◽  
pp. 14295-14298 ◽  
Author(s):  
Masayuki Nogami ◽  
Shunsuke Ito

1998 ◽  
Vol 512 ◽  
Author(s):  
C. Hecht ◽  
R. Kummer ◽  
A. Winnacker

ABSTRACTIn the context of spectral-hole burning experiments in 4H- and 6H-SiC doped with vanadium the energy positions of the V4+/5+ level in both polytypes were determined in order to resolve discrepancies in literature. From these numbers the band offset of 6H/4H-SiC is calculated by using the Langer-Heinrich rule, and found to be of staggered type II. Furthermore the experiments show that thermally stable electronic traps exist in both polytypes at room temperature and considerably above, which may result in longtime transient shifts of electronic properties.


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