Nowadays, compact and reliable electronic devices including up-to-date
ceramic micro-electro-mechanical systems require thick-film resistors with
significantly reduced dimensions and stable and precise resistance values.
For that reason, instead of standard laser trimming method, high voltage
pulse trimming of thick-film resistors is being introduced. This method
allows controlled and reliable resistance adjustment regardless of resistor
position or dimensions and without the presence of cuts. However, it causes
irreversible structural changes in the pseudorandom network formed during
sintering causing the changes in conducting mechanisms. In this paper results
of the experimental investigation of high voltage pulse trimming of
thick-film resistors are presented. Obtained results are analyzed and
correlations between resistance and low-frequency noise changes and changes
in conducting mechanisms in resistors due to high voltage pulse trimming are
observed. Sources of measured fluctuations are identified and it is shown
that this type of trimming is a valid alternative trimming method to the
dominant laser trimming.
Effects of high voltage pulse trimming on structural properties of thick-film resistors
