Observation of X-ray refraction contrast using multilayer mirrors with resonant absorption

2000 ◽  
Vol 184 (1-4) ◽  
pp. 1-6 ◽  
Author(s):  
V.V Protopopov ◽  
V.A Kalnov
Keyword(s):  
Resonant Absorption ◽  
Multilayer Mirrors ◽  
X Ray

Interdiffusion in soft X-ray multilayer mirrors

1996 ◽  
Vol 286 (1-2) ◽  
pp. 176-183 ◽  
Author(s):  
H.L Bai ◽  
E.Y Jiang ◽  
C.D Wang
Keyword(s):  
Multilayer Mirrors ◽  
X Ray

Soft X-Ray Optics Using Multilayer Mirrors

1985 ◽  
Vol 24 (1) ◽  
Author(s):  
Ping Lee ◽  
Roger J. Bartlett ◽  
Don R. Kania
Keyword(s):  
Multilayer Mirrors ◽  
Ray Optics ◽  
X Ray

Aging effect of Co/C soft X-ray multilayer mirrors

1997 ◽  
Vol 42 (6) ◽  
pp. 454-457 ◽  
Author(s):  
Haili Bai ◽  
Enyong Jiang ◽  
Renyu Tian ◽  
Cunda Wang
Keyword(s):  
Aging Effect ◽  
Multilayer Mirrors ◽  
X Ray

Si adhesion interlayer effects in hydrogen passivated Si/W soft X-ray multilayer mirrors

2006 ◽  
Vol 600 (6) ◽  
pp. 1405-1408 ◽  
Author(s):  
M.J.H. Kessels ◽  
J. Verhoeven ◽  
F.D. Tichelaar ◽  
F. Bijkerk
Keyword(s):  
Multilayer Mirrors ◽  
X Ray

scholarly journals Nested Kirkpatrick–Baez (Montel) optics for hard X-rays

2015 ◽  
Vol 48 (2) ◽  
pp. 558-564 ◽  
Author(s):  
Giacomo Resta ◽  
Boris Khaykovich ◽  
David Moncton
Keyword(s):  
Ray Tracing ◽  
Compton Scattering ◽  
Analytical Procedure ◽  
X Rays ◽  
Multilayer Mirrors ◽  
Comprehensive Description ◽  
X Ray ◽  
Inverse Compton Scattering ◽  
Inverse Compton ◽  
Proper Orientation

A comprehensive description and ray-tracing simulations are presented for symmetric nested Kirkpatrick–Baez (KB) mirrors, commonly used at synchrotrons and in commercial X-ray sources. This paper introduces an analytical procedure for determining the proper orientation between the two surfaces composing the nested KB optics. This procedure has been used to design and simulate collimating optics for a hard-X-ray inverse Compton scattering source. The resulting optical device is composed of two 12 cm-long parabolic surfaces coated with a laterally graded multilayer and is capable of collimating a 12 keV beam with a divergence of 5 mrad (FWHM) by a factor of ∼250. A description of the ray-tracing software that was developed to simulate the graded multilayer mirrors is included.

Intrinsic roughness and interfaces of Cr/Be multilayers

2021 ◽  
Vol 54 (6) ◽  
Author(s):  
Roman Pleshkov ◽  
Nikolay Chkhalo ◽  
Vladimir Polkovnikov ◽  
Mikhail Svechnikov ◽  
Maria Zorina
Keyword(s):  
Atomic Force Microscopy ◽  
Optical Contrast ◽  
Multilayer Mirrors ◽  
X Ray ◽  
Force Microscopy ◽  
Layer Material ◽  
Multilayer Mirror ◽  
X Ray Scattering ◽  
Atomic Force ◽  
Sharp Structure

The structures of Cr/Be multilayer mirror interfaces are investigated using X-ray reflectometry, diffuse X-ray scattering and atomic force microscopy. The combination of these methods makes it possible to separate the contributions of roughness and interlayer diffusion/intermixing for each sample. In the range of period thicknesses of 2.26–0.8 nm, it is found that the growth roughness of the Cr/Be multilayer mirrors does not depend on the period thickness and is ∼0.2 nm. The separation of roughness and diffuseness allows estimation of layer material intermixing and the resulting drop in the optical contrast, which is from 0.85 to 0.17 in comparison with an ideally sharp structure.

Chemical bonding state analysis of silicon carbide layers in Mo/SiC/Si multilayer mirrors by soft x-ray emission and absorption spectroscopy

2000 ◽  
Vol 77 (17) ◽  
pp. 2653-2655 ◽  
Author(s):  
Yasuji Muramatsu ◽  
Hisataka Takenaka ◽  
Yuko Ueno ◽  
Eric M. Gullikson ◽  
Rupert C. C. Perera
Keyword(s):  
Silicon Carbide ◽  
Absorption Spectroscopy ◽  
Chemical Bonding ◽  
Multilayer Mirrors ◽  
X Ray ◽  
Bonding State ◽  
Chemical Bonding State ◽  
State Analysis
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