Phase transition related stress in ferroelectric thin films

2000 ◽  
Vol 375 (1-2) ◽  
pp. 15-18 ◽  
Author(s):  
Xiaomei Lu ◽  
Jinsong Zhu ◽  
Zhiguo Liu ◽  
Xiaoshan Xu ◽  
Yening Wang
2011 ◽  
Vol 1292 ◽  
Author(s):  
Ibrahim B. Misirlioglu ◽  
Hale N. Cologlu ◽  
Mehmet Yildiz

ABSTRACTWe analyze the effect of charged defects on the electrical domains, phase transition characteristics and electrical properties of ferroelectric thin films with thin dead layers using a non-linear thermodynamic model. Depending on their density and field strength, defects can pin and couple to electrical domains in the film. For ultrathin films, depolarizing effects dominate and the transition from the paraelectric state is into the multidomain ferroelectric state during cooling and is strongly smeared. The competition between defect induced extrinsic effects and the dead layer related limit is demonstrated.


1999 ◽  
Vol 229 (1) ◽  
pp. 21-26
Author(s):  
C. L. Wang ◽  
L. Zhang ◽  
W. L. Zhong ◽  
P. L. Zhang

1996 ◽  
Vol 45 (2) ◽  
pp. 318
Author(s):  
LIU WEI-GUO ◽  
KONG LING-BING ◽  
ZHANG LIANG-YING ◽  
YAO XI

1973 ◽  
Vol 8 (7) ◽  
pp. 3257-3265 ◽  
Author(s):  
I. P. Batra ◽  
P. Wurfel ◽  
B. D. Silverman

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