ABSTRACTWe present ultrafast transient reflectivity measurements performed on metallic tin nanoparticles with an average radius between 20 and 60 Å in amorphous matrix. The samples, grown using an evaporation-condensation technique, were characterized by a relatively low nanocrystals size dispersion and a negligible clusters-matrix interaction. The excitation decays exhibited a size-dependent behaviour, which is interpreted in terms of the important role played by the electron-surface interactions.
Recently demonstrated isolated attosecond XFEL pulses should allow the probing of ultrafast electron dynamics at X-ray wavelengths. The authors use ghost imaging to enable high-resolution transient absorption spectroscopy at fluctuating XFEL sources.
Attosecond transient absorption spooktroscopy: a ghost imaging approach to ultrafast absorption spectroscopy