Microstructural studies of molybdenum silicide thin films by spectroscopic ellipsometry

1997 ◽  
Vol 30 (1) ◽  
pp. 35-40 ◽  
Author(s):  
G. Srinivas ◽  
V.D. Vankar
Keyword(s):  
Thin Films ◽  
Spectroscopic Ellipsometry ◽  
Molybdenum Silicide ◽  
Microstructural Studies

Thermodynamics and Microstructure Development in the Thin Film Reaction of Aluminum on Silicon Carbide

1995 ◽  
Vol 403 ◽  
Author(s):  
T. S. Hayes ◽  
F. T. Ray ◽  
K. P. Trumble ◽  
E. P. Kvam
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Silicon Carbide ◽  
Ohmic Contacts ◽  
Microstructure Development ◽  
P Type ◽  
Microstructural Studies

AbstractA refined thernodynamic analysis of the reaction between molen Al and SiC is presented. The calculations indicate much higher Si concentrations for saturation with respect to AkC 3 formation than previously reported. Preliminary microstructural studies confirm the formation of interfacial A14C3 for pure Al thin films on SiC reacted at 9000C. The implications of the calculations and experimental observations for the production of ohmic contacts to p-type SiC are discussed.

Strong optical anisotropies of F16CuPc thin films studied by spectroscopic ellipsometry

2003 ◽  
Vol 119 (12) ◽  
pp. 6335-6340 ◽  
Author(s):  
M. I. Alonso ◽  
M. Garriga ◽  
J. O. Ossó ◽  
F. Schreiber ◽  
E. Barrena ◽  
...  
Keyword(s):  
Thin Films ◽  
Spectroscopic Ellipsometry

scholarly journals Fully automated spectroscopic ellipsometry analyses: Application to MoOx thin films

2021 ◽  
Vol 129 (24) ◽  
pp. 243102
Author(s):  
Kohei Oiwake ◽  
Yukinori Nishigaki ◽  
Shohei Fujimoto ◽  
Sara Maeda ◽  
Hiroyuki Fujiwara
Keyword(s):  
Thin Films ◽  
Spectroscopic Ellipsometry

Optical constants of DC magnetron sputtered titanium dioxide thin films measured by spectroscopic ellipsometry

2003 ◽  
Vol 38 (9) ◽  
pp. 773-778 ◽  
Author(s):  
B. Karunagaran ◽  
R. T. Rajendra Kumar ◽  
C. Viswanathan ◽  
D. Mangalaraj ◽  
Sa. K. Narayandass ◽  
...  
Keyword(s):  
Thin Films ◽  
Titanium Dioxide ◽  
Spectroscopic Ellipsometry ◽  
Optical Constants ◽  
Titanium Dioxide Thin Films

Vacuum ultra-violet spectroscopic ellipsometry study of sputtered BeZnO thin films

Optik ◽  
2011 ◽  
Vol 122 (22) ◽  
pp. 2050-2054 ◽  
Author(s):  
Jebreel M. Khoshman ◽  
Martin E. Kordesch
Keyword(s):  
Thin Films ◽  
Spectroscopic Ellipsometry ◽  
Ultra Violet ◽  
Vacuum Ultra Violet
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