In situ study of strain evolution during thin film Ti/Al(Si,Cu) reaction using synchrotron radiation
2002 ◽
Vol 64
(1-4)
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pp. 81-89
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1988 ◽
Vol 92
(25)
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pp. 7045-7052
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2019 ◽
Vol 35
(7)
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pp. 1388-1392
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2018 ◽
Vol 335
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pp. 355-367
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Keyword(s):
2007 ◽
Vol 575
(1-2)
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pp. 126-129
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