Asymmetry of interface reactions in Ag-Sn thin film couples—In-situ synchrotron radiation study
2009 ◽
Vol 15
(48)
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pp. 13381-13390
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Keyword(s):
2000 ◽
Vol 07
(03)
◽
pp. 235-242
◽
2016 ◽
Vol 120
(11)
◽
pp. 6165-6179
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Keyword(s):
In situ study of strain evolution during thin film Ti/Al(Si,Cu) reaction using synchrotron radiation
2002 ◽
Vol 64
(1-4)
◽
pp. 81-89
◽
2003 ◽
Vol 199
◽
pp. 133-138
◽
Keyword(s):
2014 ◽
Vol 46
(1)
◽
pp. 41-45
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