Grazing incidence diffraction anomalous fine structure of self-assembled semiconductor nanostructures

2003 ◽  
Vol 200 ◽  
pp. 24-33 ◽  
Author(s):  
S. Grenier ◽  
A. Letoublon ◽  
M.G. Proietti ◽  
H. Renevier ◽  
L. González ◽  
...  
Keyword(s):  
Fine Structure ◽  
Grazing Incidence ◽  
Semiconductor Nanostructures ◽  
Grazing Incidence Diffraction ◽  
Self Assembled

scholarly journals Grazing-incidence diffraction anomalous fine structure of InAs/InP(001) self-assembled quantum wires

2002 ◽  
Vol 57 (4) ◽  
pp. 499-505 ◽  
Author(s):  
S Grenier ◽  
M. G Proietti ◽  
H Renevier ◽  
L González ◽  
J. M García ◽  
...  
Keyword(s):  
Fine Structure ◽  
Quantum Wires ◽  
Grazing Incidence ◽  
Grazing Incidence Diffraction ◽  
Self Assembled

Characterization of lateral semiconductor nanostructures by means of x-ray grazing-incidence diffraction

1997 ◽  
Vol 70 (8) ◽  
pp. 1031-1033 ◽  
Author(s):  
K. Paschke ◽  
T. Geue ◽  
T. A. Barberka ◽  
A. Bolm ◽  
U. Pietsch ◽  
...  
Keyword(s):  
Grazing Incidence ◽  
Semiconductor Nanostructures ◽  
X Ray ◽  
Grazing Incidence Diffraction

In situ andex situ grazing incidence diffraction anomalous fine structure study of GaN/AlN quantum dots

2006 ◽  
Vol 243 (7) ◽  
pp. 1519-1523 ◽  
Author(s):  
J. Coraux ◽  
H. Renevier ◽  
M. G. Proietti ◽  
V. Favre-Nicolin ◽  
B. Daudin ◽  
...  
Keyword(s):  
Quantum Dots ◽  
Fine Structure ◽  
Grazing Incidence ◽  
Structure Study ◽  
Grazing Incidence Diffraction
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