On the formation of oriented nanometer scale patterns on amorphous polymer surfaces studied by atomic force microscopy

1999 ◽  
Vol 148 (3-4) ◽  
pp. 147-154 ◽  
Author(s):  
J.P Pickering ◽  
G.J Vancso
Keyword(s):  
Atomic Force Microscopy ◽  
Amorphous Polymer ◽  
Polymer Surfaces ◽  
Nanometer Scale ◽  
Force Microscopy ◽  
Atomic Force

Atomic Force Microscopy and Related Techniques: Introduction, Instrumentation and Application to Polymeric Materials

1998 ◽  
Vol 4 (S2) ◽  
pp. 822-823
Author(s):  
Inga Holl Musselman
Keyword(s):  
Atomic Force Microscopy ◽  
Polymeric Materials ◽  
Polymer Surfaces ◽  
Nanometer Scale ◽  
Important Class ◽  
Semiconducting Materials ◽  
Contact Mode ◽  
Cantilever Deflection ◽  
Force Microscopy ◽  
Atomic Force

Atomic force microscopy (AFM) was introduced in 1986 by Binnig, Quate and Gerber. In this method, a sample is scanned beneath a small, sharp silicon or silicon nitride probe attached to the apex of a flexible cantilever. Cantilever deflection is measured to give height information corresponding to the sample topography. Since AFM relies on tip-sample force interaction, the technique can be applied to insulators as well as to conducting and semiconducting materials. AFM therefore extends local probe studies to an important class of materials which can be difficult to investigate by electron microscopy and spectroscopy techniques owing to problems with sample charging. Among other materials, AFM has been used extensively to characterize the morphology, roughness, nanostructure, chain packing and conformation of polymer surfaces at the nanometer scale.Early AFM studies of polymers were conducted in the contact mode and included the investigation of polymerized monolayers of n-(2-aminoethyl)-10,12-tricosadiynamide (AE-TDA) and poly(octadecylacrylate) (PODA) at submonolayer coverage.

scholarly journals Substrate Chemistry-Dependent Conformations of Single Laminin Molecules on Polymer Surfaces are Revealed by the Phase Signal of Atomic Force Microscopy

2007 ◽  
Vol 93 (1) ◽  
pp. 202-207 ◽  
Author(s):  
Jose Carlos Rodríguez Hernández ◽  
Manuel Salmerón Sánchez ◽  
José Miguel Soria ◽  
José Luis Gómez Ribelles ◽  
Manuel Monleón Pradas
Keyword(s):  
Atomic Force Microscopy ◽  
Polymer Surfaces ◽  
Force Microscopy ◽  
Atomic Force ◽  
Phase Signal

scholarly journals Assessing dystrophies and other muscle diseases at the nanometer scale by atomic force microscopy

Nanomedicine ◽  
2014 ◽  
Vol 9 (4) ◽  
pp. 393-406 ◽  
Author(s):  
Ruthger W van Zwieten ◽  
Stefania Puttini ◽  
Małgorzata Lekka ◽  
Guillaume Witz ◽  
Evelyne Gicquel-Zouida ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Nanometer Scale ◽  
Muscle Diseases ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Nanometer-scale electrical characterization of stressed ultrathin SiO2 films using conducting atomic force microscopy

2001 ◽  
Vol 78 (26) ◽  
pp. 4181-4183 ◽  
Author(s):  
M. Porti ◽  
M. Nafrı́a ◽  
X. Aymerich ◽  
A. Olbrich ◽  
B. Ebersberger
Keyword(s):  
Atomic Force Microscopy ◽  
Electrical Characterization ◽  
Nanometer Scale ◽  
Sio2 Films ◽  
Force Microscopy ◽  
Atomic Force

427 Nanometer-scale fabrication of organic photosensitive polymer using atomic force microscopy

2001 ◽  
Vol 2001.7 (0) ◽  
pp. 171-172
Author(s):  
F. IWATA ◽  
K. KOBAYASHI ◽  
A. SASAKI ◽  
Y. KAWATA ◽  
C. EGAMI ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Nanometer Scale ◽  
Force Microscopy ◽  
Atomic Force ◽  
Photosensitive Polymer
Sign in / Sign up

Export Citation Format

Share Document